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Issue Date	Title	Author(s)
20-Feb-2005	Wavelet analysis of speckle patterns with a temporal carrier	Fu, Y. ; Tay, C.J. ; Quan, C. ; Miao, H.
Feb-1993	Whole field measurement of surface roughness using laser speckle	Tay, C.J. ; Toh, S.L. ; Shang, H.M. ; Zhang, J.B.
Sep-2001	Whole field surface roughness measurement by laser speckle correlation technique	Toh, S.L. ; Quan, C. ; Woo, K.C.; Tay, C.J. ; Shang, H.M.

Showing results 260 to 262 of 262 < previous