Browsing by Author TAY CHO JUI

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Issue DateTitleAuthor(s)
May-2000Laser integrated measurement of surface roughness and micro-displacementWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. ; Zhou, Z.F.
15-Jan-2006Lau phase interferometry with a vibrating objectQuan, C. ; Thakur, M. ; Tay, C.J. 
2009Line end shortening and corner rounding for novel off-axis illumination source shapesLing, M.L.; Chua, G.S.; Lin, Q.; Tay, C.J. ; Quan, C. 
2001Mask error enhancement factor for sub 0.13μm lithographyTan, S.K.; Lin, Q.; Quan, C. ; Tay, C.J. ; See, A. 
1-Jan-2004Measurement of a fiber-end surface profile by use of phase-shifting laser interferometryWang, S. ; Quan, C. ; Tay, C.J. ; Reading, I.; Fang, Z.
15-Apr-2004Measurement of a micro-solderball height using a laser projection methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Lee, B.W.; Chan, K.C.
Mar-2001Measurement of a microphone membrane deflection profile using an optical fibre and wedge fringe projectionTay, C.J. ; Quan, C. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
2001Measurement of angle of rotation using circular optical gratingShang, H.M. ; Toh, S.L. ; Fu, Y. ; Quan, C. ; Tay, C.J. 
20-May-2008Measurement of curvature and twist of a deformed object using digital holographyChen, W. ; Quan, C. ; Tay, C.J. 
15-Apr-2005Measurement of focal length of lens using phase shifting Lau phase interferometryTay, C.J. ; Thakur, M. ; Chen, L.; Shakher, C.
Jul-1996Measurement of slopes and profile of an optical lens by shearographyTay, C.J. ; Shang, H.M. ; Neo, A.L.
2005Measurement of transparent coating thickness by the use of white light interferometryLi, M.; Quan, C. ; Tay, C.J. ; Reading, I.; Wang, S. 
Aug-1996Measurement of Y-notch tip plastic zone by the laser speckle techniqueTay, C.J. ; Tay, T.E. ; Shang, H.M. 
Aug-1992Measurements of surface coordinates and slopes by shearographyTay, C.J. ; Shang, H.M. ; Poo, A.N. ; Luo, M.
Apr-1991Measuring the curvatures of machined surfaces using laser speckle interferometryShang, H.M. ; Chau, F.S. ; Shim, V.P.W. ; Tay, C.J. ; Toh, S.L. 
2002MEF studies for attenuated phase shift mask for sub 0.13 um technology using 248 nmTan, S.K.; Lin, Q.; Chua, G.S.; Quan, C. ; Tay, C.J. 
28-May-2013Methods for enhancing photolithography patterningLING, MOH LUNG; CHUA, GEK SOON; LIN, QUNYING; TAY, CHO JUI ; QUAN, CHENGGEN 
2008Micro-components evaluation using laser interferometryTay, C.J. 
15-May-2011Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.; Gao, Z.
Oct-2002Microscopic surface contouring by fringe projection methodQuan, C. ; Tay, C.J. ; He, X.Y.; Kang, X. ; Shang, H.M.