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TAY CHO JUI
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Showing results 130 to 149 of 262
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Issue Date
Title
Author(s)
May-2000
Laser integrated measurement of surface roughness and micro-displacement
Wang, S.H.
;
Tay, C.J.
;
Quan, C.
;
Shang, H.M.
;
Zhou, Z.F.
15-Jan-2006
Lau phase interferometry with a vibrating object
Quan, C.
;
Thakur, M.
;
Tay, C.J.
2009
Line end shortening and corner rounding for novel off-axis illumination source shapes
Ling, M.L.
;
Chua, G.S.
;
Lin, Q.
;
Tay, C.J.
;
Quan, C.
2001
Mask error enhancement factor for sub 0.13μm lithography
Tan, S.K.
;
Lin, Q.
;
Quan, C.
;
Tay, C.J.
;
See, A.
1-Jan-2004
Measurement of a fiber-end surface profile by use of phase-shifting laser interferometry
Wang, S.
;
Quan, C.
;
Tay, C.J.
;
Reading, I.
;
Fang, Z.
15-Apr-2004
Measurement of a micro-solderball height using a laser projection method
Tay, C.J.
;
Wang, S.H.
;
Quan, C.
;
Lee, B.W.
;
Chan, K.C.
Mar-2001
Measurement of a microphone membrane deflection profile using an optical fibre and wedge fringe projection
Tay, C.J.
;
Quan, C.
;
Wang, S.H.
;
Shang, H.M.
;
Chan, K.C.
2001
Measurement of angle of rotation using circular optical grating
Shang, H.M.
;
Toh, S.L.
;
Fu, Y.
;
Quan, C.
;
Tay, C.J.
20-May-2008
Measurement of curvature and twist of a deformed object using digital holography
Chen, W.
;
Quan, C.
;
Tay, C.J.
15-Apr-2005
Measurement of focal length of lens using phase shifting Lau phase interferometry
Tay, C.J.
;
Thakur, M.
;
Chen, L.
;
Shakher, C.
Jul-1996
Measurement of slopes and profile of an optical lens by shearography
Tay, C.J.
;
Shang, H.M.
;
Neo, A.L.
2005
Measurement of transparent coating thickness by the use of white light interferometry
Li, M.
;
Quan, C.
;
Tay, C.J.
;
Reading, I.
;
Wang, S.
Aug-1996
Measurement of Y-notch tip plastic zone by the laser speckle technique
Tay, C.J.
;
Tay, T.E.
;
Shang, H.M.
Aug-1992
Measurements of surface coordinates and slopes by shearography
Tay, C.J.
;
Shang, H.M.
;
Poo, A.N.
;
Luo, M.
Apr-1991
Measuring the curvatures of machined surfaces using laser speckle interferometry
Shang, H.M.
;
Chau, F.S.
;
Shim, V.P.W.
;
Tay, C.J.
;
Toh, S.L.
2002
MEF studies for attenuated phase shift mask for sub 0.13 um technology using 248 nm
Tan, S.K.
;
Lin, Q.
;
Chua, G.S.
;
Quan, C.
;
Tay, C.J.
28-May-2013
Methods for enhancing photolithography patterning
LING, MOH LUNG
;
CHUA, GEK SOON
;
LIN, QUNYING
;
TAY, CHO JUI
;
QUAN, CHENGGEN
2008
Micro-components evaluation using laser interferometry
Tay, C.J.
15-May-2011
Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometry
Ma, S.
;
Quan, C.
;
Zhu, R.
;
Tay, C.J.
;
Chen, L.
;
Gao, Z.
Oct-2002
Microscopic surface contouring by fringe projection method
Quan, C.
;
Tay, C.J.
;
He, X.Y.
;
Kang, X.
;
Shang, H.M.