Browsing by Author TAY CHO JUI

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Issue DateTitleAuthor(s)
20043-D deformation measurement using fringe projection and digital image correlationQuan, C. ; Tay, C.J. ; Huang, Y.H.
20013D surface profile measurement using LCD fringe projectionQuan, C. ; He, X.Y.; Tay, C.J. ; Shang, H.M. 
2007A comparative study for mask defect tolerance on phase and transmission for dry and immersion 193-nm lithographyLing, M.L.; Chua, G.S.; Tay, C.J. ; Quan, C. ; Lin, Q.
1-Mar-2012A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometryMa, S.; Quan, C. ; Zhu, R.; Chen, L.; Li, B.; Tay, C.J. 
2004A genetic optical interferometric inspection on micro-deformationWang, S.H. ; Quan, C. ; Tay, C.J. 
2011A MEMS-based piezoelectric cantilever patterned with PZT thin film array for harvesting energy from low frequency vibrationsLiu, H.; Quan, C. ; Tay, C.J. ; Kobayashi, T.; Lee, C. 
2011A MEMS-based wideband piezoelectric energy harvester system using mechanical stoppersLiu, H.; Lee, C. ; Kobayashi, T.; Tay, C.J. ; Quan, C. 
2010A modified WFT for shape and deformation measurementNiu, H.; Quan, C. ; Tay, C.J. 
Feb-1998A new method for generating and analysing digital speckle shearing correlation fringe patternsHe, Y.M.; Tay, C.J. ; Shang, H.M. 
15-Sep-2004A new method for phase extraction from a single fringe patternTay, C.J. ; Quan, C. ; Yang, F.J.; He, X.Y.
2007A new method for phase measurement on non-monotonous fringesSun, W. ; Quan, C. ; Tay, C.J. ; He, X.Y.
Apr-2012A new S-shaped MEMS PZT cantilever for energy harvesting from low frequency vibrations below 30 HzLiu, H.; Lee, C. ; Kobayashi, T.; Tay, C.J. ; Quan, C. 
2003A parametric study on surface roughness evaluation of semi-conductor wafers by laser scatteringTay, C.J. ; Quan, C. 
Dec-2011A scrape-through piezoelectric MEMS energy harvester with frequency broadband and up-conversion behaviorsLiu, H.; Tay, C.J. ; Quan, C. ; Kobayashi, T.; Lee, C. 
1994A simple model for sizing unbonds in foam-adhesive bonded laminates from shearographic fringesShang, H.M. ; Chau, F.S. ; Tay, C.J. ; Toh, S.L. ; Tham, L.M.
Sep-2007A study on carrier-removal techniques in fringe projection profilometryQuan, C. ; Tay, C.J. ; Chen, L.J.
25-Jan-2000AlxGa1-xAs semiconductor sensor for contact pressure measurementToh, S.-L. ; Tay, C.-J. ; Ng, S.-H.; Rahman, M. 
Oct-1986An approximate solution for the hydrostatic bulging of circular diaphragms with draw-in allowedShang, H.M. ; Chau, F.S. ; Tay, C.J. ; Toh, S.L. 
Feb-2010An improved windowed Fourier transform for fringe demodulationQuan, C. ; Niu, H.; Tay, C.J. 
Apr-2005An optical shadowgraph microscope for a semiconductor wafer bump height measurementWang, S. ; Quan, C. ; Tay, C.J.