Browsing by Author TAY CHO JUI

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Showing results 247 to 262 of 262 < previous 
Issue DateTitleAuthor(s)
2006The study of Chromeless Phase Lithography (CPL) for 45nm lithographySoon, Y.T.; Qunying, L.; Cho, J.T. ; Chenggen, Q. 
Jul-2001The use of carrier fringes and FFT in holographic nondestructive testingQuan, C. ; Tay, C.J. ; Shang, H.M. 
Nov-2001The use of circular optical grating for measuring angular rotation of mirrorsShang, H.M. ; Toh, S.L. ; Fu, Y. ; Quan, C. ; Tay, C.J. 
Sep-1997Time delay and integration imaging for inspection and profilometry of moving objectsMarokkey, S.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A.K.
Nov-1998Time delay and integration imaging for internal profile inspectionTay, C.J. ; Toh, S.L. ; Shang, H.M. 
Feb-1995Time-average shearography in vibration analysisToh, S.L. ; Tay, C.J. ; Shang, H.M. ; Lin, Q.Y.
1997Triple-exposure shearography for the measurement of surface slopesTay, C.J. ; Shang, H.M. ; Choong, D.
15-May-2011Two wavelength simultaneous DSPI and DSP for 3D displacement field measurementsBhaduri, B. ; Tay, C.J. ; Quan, C. ; Niu, H.; Sjödahl, M.
2010Two-step dc-term-suppressed phase shifting technique in DSPIBhaduri, B. ; Tay, C.J. ; Quan, C. 
Dec-2001Using laser scattering for detection of cracks on a microsolderball surfaceWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
1-Jun-2007Vibration measurement by use of wavelet transform and temporal carrier techniqueQuan, C. ; Fu, Y. ; Tay, C.J. 
2009Vibration measurement of a micro-structure by digital holographic microscopyShi, H. ; Fu, Y. ; Quan, C. ; Tay, C.J. ; He, X.
2003Vibration measurement of micro-components by fringe projection methodWu, T.; Tay, C. ; Quan, C. ; Wang, S. ; Shang, H.
20-Feb-2005Wavelet analysis of speckle patterns with a temporal carrierFu, Y. ; Tay, C.J. ; Quan, C. ; Miao, H. 
Feb-1993Whole field measurement of surface roughness using laser speckleTay, C.J. ; Toh, S.L. ; Shang, H.M. ; Zhang, J.B.
Sep-2001Whole field surface roughness measurement by laser speckle correlation techniqueToh, S.L. ; Quan, C. ; Woo, K.C.; Tay, C.J. ; Shang, H.M.