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Browsing by Author TAY CHO JUI

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Showing results 237 to 256 of 262 < previous   next >
Issue DateTitleAuthor(s)
Feb-1998Surface-roughness study using laser speckle methodToh, S.L. ; Shang, H.M. ; Tay, C.J. 
Jun-1998TDI imaging - a tool for profilometry and automated visual inspectionSajan, M.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A. 
Sep-1997TDI imaging and scanning moiré for online defect detectionSajan, M.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A.
2008Temporal Paul wavelet analysis for phase retrieval using shadow moiré techniqueNiu, H.T.; Quan, C. ; Tay, C.J. 
2005Temporal phase analysis techniques using wavelet transformQuan, C. ; Fu, Y. ; Tay, C.J. 
15-Jun-2007Temporal phase retrieval from a complex field in digital holographic interferometryChenggen, Q. ; Cho, J.T. ; Hao, C.
Nov-2004Temporal wavelet analysis for deformation and velocity measurement in speckle interferometryFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
2005Temporal wavelet analysis for deformation measurement of small components using micro-ESPIFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
2003The Influence of Process Parameters on Forged Magnesium AlloysChan, C.F.; Yong, M.S.; Tay, C.J. ; Shang, H.M. 
1991The measurement of slope using shearographyTay, C.J. ; Chau, F.S. ; Shang, H.M. ; Shim, V.P.W. ; Toh, S.L. 
2006The study of Chromeless Phase Lithography (CPL) for 45nm lithographySoon, Y.T.; Qunying, L.; Cho, J.T. ; Chenggen, Q. 
Jul-2001The use of carrier fringes and FFT in holographic nondestructive testingQuan, C. ; Tay, C.J. ; Shang, H.M. 
Nov-2001The use of circular optical grating for measuring angular rotation of mirrorsShang, H.M. ; Toh, S.L. ; Fu, Y. ; Quan, C. ; Tay, C.J. 
Sep-1997Time delay and integration imaging for inspection and profilometry of moving objectsMarokkey, S.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A.K.
Nov-1998Time delay and integration imaging for internal profile inspectionTay, C.J. ; Toh, S.L. ; Shang, H.M. 
Feb-1995Time-average shearography in vibration analysisToh, S.L. ; Tay, C.J. ; Shang, H.M. ; Lin, Q.Y.
1997Triple-exposure shearography for the measurement of surface slopesTay, C.J. ; Shang, H.M. ; Choong, D.
15-May-2011Two wavelength simultaneous DSPI and DSP for 3D displacement field measurementsBhaduri, B. ; Tay, C.J. ; Quan, C. ; Niu, H.; Sjödahl, M.
2010Two-step dc-term-suppressed phase shifting technique in DSPIBhaduri, B. ; Tay, C.J. ; Quan, C. 
Dec-2001Using laser scattering for detection of cracks on a microsolderball surfaceWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
Showing results 237 to 256 of 262 < previous   next >