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TAY CHO JUI
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Showing results 237 to 256 of 262
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Issue Date
Title
Author(s)
Feb-1998
Surface-roughness study using laser speckle method
Toh, S.L.
;
Shang, H.M.
;
Tay, C.J.
Jun-1998
TDI imaging - a tool for profilometry and automated visual inspection
Sajan, M.R.
;
Tay, C.J.
;
Shang, H.M.
;
Asundi, A.
Sep-1997
TDI imaging and scanning moiré for online defect detection
Sajan, M.R.
;
Tay, C.J.
;
Shang, H.M.
;
Asundi, A.
2008
Temporal Paul wavelet analysis for phase retrieval using shadow moiré technique
Niu, H.T.
;
Quan, C.
;
Tay, C.J.
2005
Temporal phase analysis techniques using wavelet transform
Quan, C.
;
Fu, Y.
;
Tay, C.J.
15-Jun-2007
Temporal phase retrieval from a complex field in digital holographic interferometry
Chenggen, Q.
;
Cho, J.T.
;
Hao, C.
Nov-2004
Temporal wavelet analysis for deformation and velocity measurement in speckle interferometry
Fu, Y.
;
Tay, C.J.
;
Quan, C.
;
Chen, L.J.
2005
Temporal wavelet analysis for deformation measurement of small components using micro-ESPI
Fu, Y.
;
Tay, C.J.
;
Quan, C.
;
Chen, L.J.
2003
The Influence of Process Parameters on Forged Magnesium Alloys
Chan, C.F.
;
Yong, M.S.
;
Tay, C.J.
;
Shang, H.M.
1991
The measurement of slope using shearography
Tay, C.J.
;
Chau, F.S.
;
Shang, H.M.
;
Shim, V.P.W.
;
Toh, S.L.
2006
The study of Chromeless Phase Lithography (CPL) for 45nm lithography
Soon, Y.T.
;
Qunying, L.
;
Cho, J.T.
;
Chenggen, Q.
Jul-2001
The use of carrier fringes and FFT in holographic nondestructive testing
Quan, C.
;
Tay, C.J.
;
Shang, H.M.
Nov-2001
The use of circular optical grating for measuring angular rotation of mirrors
Shang, H.M.
;
Toh, S.L.
;
Fu, Y.
;
Quan, C.
;
Tay, C.J.
Sep-1997
Time delay and integration imaging for inspection and profilometry of moving objects
Marokkey, S.R.
;
Tay, C.J.
;
Shang, H.M.
;
Asundi, A.K.
Nov-1998
Time delay and integration imaging for internal profile inspection
Tay, C.J.
;
Toh, S.L.
;
Shang, H.M.
Feb-1995
Time-average shearography in vibration analysis
Toh, S.L.
;
Tay, C.J.
;
Shang, H.M.
;
Lin, Q.Y.
1997
Triple-exposure shearography for the measurement of surface slopes
Tay, C.J.
;
Shang, H.M.
;
Choong, D.
15-May-2011
Two wavelength simultaneous DSPI and DSP for 3D displacement field measurements
Bhaduri, B.
;
Tay, C.J.
;
Quan, C.
;
Niu, H.
;
Sjödahl, M.
2010
Two-step dc-term-suppressed phase shifting technique in DSPI
Bhaduri, B.
;
Tay, C.J.
;
Quan, C.
Dec-2001
Using laser scattering for detection of cracks on a microsolderball surface
Wang, S.H.
;
Quan, C.
;
Tay, C.J.
;
Shang, H.M.