Browsing by Author TAY CHO JUI

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Issue DateTitleAuthor(s)
2002Sub-0.10 μm Lithography technology with resolution enhancement techniqueChua, G.S.; Lin, Q.; Tay, C.J. ; Quan, C. 
2005Surface contour measurement by grating projection method based on Talbot effectThakur, M. ; Quan, C. ; Tay, C.J. 
20-May-2011Surface profile measurement in white-light scanning interferometry using a three-chip color CCDMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.
Sep-2004Surface profile measurement of low-frequency vibrating objects using temporal analysis of fringe patternTay, C.J. ; Quan, C. ; Fu, Y. ; Chen, L.J.; Shang, H.M.
1-May-2005Surface profiling of a transparent object by use of phase-shifting Talbot interferometryThakur, M. ; Tay, C.J. ; Quan, C. 
Apr-2007Surface profiling using fringe projection technique based on Lau effectThakur, M. ; Quan, C. ; Tay, C.J. 
Oct-2004Surface roughness investigation of semi-conductor wafersTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, B.L.; Chan, K.C.
Jun-2000Surface roughness measurement in the submicrometer range using laser scatteringWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
2002Surface roughness measurement of semi-conductor wafers using a modified total integrated scattering modelTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, C.K.
26-Mar-1998Surface-roughness Study Using Laser Speckle MethodToh, S.L. ; Shang, H.M. ; Tay, C.J. 
Feb-1998Surface-roughness study using laser speckle methodToh, S.L. ; Shang, H.M. ; Tay, C.J. 
Jun-1998TDI imaging - a tool for profilometry and automated visual inspectionSajan, M.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A. 
Sep-1997TDI imaging and scanning moiré for online defect detectionSajan, M.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A.
2008Temporal Paul wavelet analysis for phase retrieval using shadow moiré techniqueNiu, H.T.; Quan, C. ; Tay, C.J. 
2005Temporal phase analysis techniques using wavelet transformQuan, C. ; Fu, Y. ; Tay, C.J. 
15-Jun-2007Temporal phase retrieval from a complex field in digital holographic interferometryChenggen, Q. ; Cho, J.T. ; Hao, C.
Nov-2004Temporal wavelet analysis for deformation and velocity measurement in speckle interferometryFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
2005Temporal wavelet analysis for deformation measurement of small components using micro-ESPIFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
2003The Influence of Process Parameters on Forged Magnesium AlloysChan, C.F.; Yong, M.S.; Tay, C.J. ; Shang, H.M. 
1991The measurement of slope using shearographyTay, C.J. ; Chau, F.S. ; Shang, H.M. ; Shim, V.P.W. ; Toh, S.L.