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Browsing by Author TAY CHO JUI

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Showing results 218 to 237 of 262 < previous   next >
Issue DateTitleAuthor(s)
2009Soft tissue strain measurement using an optical methodLok, T.S. ; Jui, T.C. ; James, G.C.H. 
Dec-1989Some examples of nondestructive flaw detection by shearographyChau, F.S. ; Toh, S.L. ; Tay, C.J. ; Shang, H.M. 
10-Dec-2003Spatial-fringe-modulation-based quality map for phase unwrappingQuan, C. ; Tay, C.J. ; Chen, L.; Fu, Y. 
2007Speckle noise reduction in digital holography by multiple hologramsQuan, C. ; Kang, X. ; Tay, C.J. 
2010Stress gradient of a micro-optoelectromechanical systems Fabry-Perot cavity based on InPTay, C.J. ; Quan, C. ; Liu, H.; Gopal, M.; Akkipeddi, R.
Jan-1997Stretching during axisymmetrical forming of sheet metalQin, S. ; Shang, H.M. ; Tay, C.J. ; Mo, J.
2001Study of collimating laser diode beam by a graded-index optical fibreWang, H.; Tay, C.J. ; Quan, C. ; Shang, H.M. 
1-Oct-2001Study on deformation of a microphone membrane using multiple-wavelength interferometryQuan, C. ; Tay, C.J. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
May-2006Study on the use of white light interferometry for multifiber-end surface profile measurementQuan, C. ; Wang, S.H. ; Tay, C.J. ; Reading, I.
2002Sub-0.10 μm Lithography technology with resolution enhancement techniqueChua, G.S.; Lin, Q.; Tay, C.J. ; Quan, C. 
2005Surface contour measurement by grating projection method based on Talbot effectThakur, M. ; Quan, C. ; Tay, C.J. 
20-May-2011Surface profile measurement in white-light scanning interferometry using a three-chip color CCDMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.
Sep-2004Surface profile measurement of low-frequency vibrating objects using temporal analysis of fringe patternTay, C.J. ; Quan, C. ; Fu, Y. ; Chen, L.J.; Shang, H.M.
1-May-2005Surface profiling of a transparent object by use of phase-shifting Talbot interferometryThakur, M. ; Tay, C.J. ; Quan, C. 
Apr-2007Surface profiling using fringe projection technique based on Lau effectThakur, M. ; Quan, C. ; Tay, C.J. 
Oct-2004Surface roughness investigation of semi-conductor wafersTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, B.L.; Chan, K.C.
Jun-2000Surface roughness measurement in the submicrometer range using laser scatteringWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
2002Surface roughness measurement of semi-conductor wafers using a modified total integrated scattering modelTay, C.J. ; Wang, S.H. ; Quan, C. ; Ng, C.K.
26-Mar-1998Surface-roughness Study Using Laser Speckle MethodToh, S.L. ; Shang, H.M. ; Tay, C.J. 
Feb-1998Surface-roughness study using laser speckle methodToh, S.L. ; Shang, H.M. ; Tay, C.J. 
Showing results 218 to 237 of 262 < previous   next >