Browsing by Author TAY CHO JUI

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Issue DateTitleAuthor(s)
Feb-2007Analysis of phase distortion in phase-shifted fringe projectionMiao, H. ; Quan, C. ; Tay, C.J. ; Fu, Y. 
1-Sep-1993Analysis of shearogram reconstructionToh, S.L. ; Tay, C.J. ; Shang, H.M. ; Lin, Q.Y.
1-Sep-1993Analysis of shearogram reconstructionToh, S.L. ; Tay, C.J. ; Shang, H.M. ; Lin, Q.Y.
1-Apr-2006Application of an optical interferometer for measuring the surface contour of micro-componentsWang, S.H.; Tay, C.J. 
Jul-2011Application of least-square estimation in white-light scanning interferometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.; Gao, Z.
Nov-1990Application of shearography in nondestructive testing of composite platesToh, S.L. ; Chau, F.S. ; Shim, V.P.W. ; Tay, C.J. ; Shang, H.M. 
1984ASSESSMENT OF BEHAVIOUR OF SHEET METAL DURING HYDROFORMING.Shang, H.M. ; Chau, F.S. ; Tay, C.J. ; Toh, S.L. 
1-Nov-2001Beam-splitting cube for fringe-projection, holographic, and shearographic interferometryShang, H.M. ; Hung, M.Y.Y. ; Quan, C.G. ; Tay, C.J. 
1-Apr-2012Blind phase error suppression for color-encoded digital fringe projection profilometryMa, S.; Zhu, R.; Quan, C. ; Li, B.; Tay, C.J. ; Chen, L.
Feb-2006Carrier phase component removal: A generalized least-squares approachChen, L.; Tay, C.-J. 
Jan-1992Cavitation during superplastic forming of two-phase alloysShang, H.M. ; Chau, F.S. ; Shim, V.P.M. ; Tay, C.J. ; Toh, S.L. 
2001Characterization of assist features on impact of mask error enhancement factors for sub-0.13 um technologyTan, S.K.; Lin, Q.; Tay, C.J. ; Quan, C. 
Mar-2011Circular apertures for contact hole patterning in 193 nm immersion lithographyTay, C.J. ; Quan, C. ; Ling, M.L.; Chua, G.S.; Tan, S.K.; Lin, Q.
2010Circular apertures for contact hole patterning in 193nm immersion lithographyTay, C.J. ; Quan, C. ; Ling, M.L.; Lin, Q.; Tan, S.K.; Chua, G.S.
Aug-2000Collimating of diverging laser diode beam using graded-index optical fiberWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. 
Mar-2010Color image encryption based on interference and virtual opticsTay, C.J. ; Quan, C. ; Chen, W. ; Fu, Y. 
28-Feb-2005Contact pressure measurement using silicon-based AlxGa 1-xAs semiconductor pressure sensorsTun, T.N.; Lok, T.S. ; Jui, T.C. ; Akkipeddi, R. ; Rahman, M. 
13-Jan-2005CONTACT PRESSURE SENSOR AND METHOD FOR MANUFACTURING THE SAMEAKKIPEDDI, RAMAM ; SPERRING, CHRISTOPHER PHILIP; TOH, SIEW LOK ; TAY, CHO JUI ; RAHMAN, MUSTAFIZUR ; CHUA, SOO JIN 
31-Oct-2006Contact pressure sensor and method for manufacturing the sameAKKIPEDDI, RAMAM ; SPERRING, CHRISTOPHER P; TOH, SIEW LOK ; TAY, CHO JUI ; RAHMAN, MUSTAFIZUR ; CHUA, SOO JIN 
3-May-2006CONTACT PRESSURE SENSOR AND METHOD FOR MANUFACTURING THE SAMEAKKIPEDDI, RAMAM ; SPERRING, CHRISTOPHER PHILIP; TOH, SIEW LOK ; TAY, CHO JUI ; RAHMAN, MUSTAFIZUR ; CHUA, SOO JIN