Browsing by Author Wong Wai Kin

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Showing results 17 to 32 of 32 < previous 
Issue DateTitleAuthor(s)
1995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
1995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
14-May-2006In situ observation of localized metallic nanocrystal growth on carbon nanotube templates in a scanning electron microscopeWong, W.-K. ; Lim, S.-H.; Thong, J.T.L. 
20-Jul-2007In-plane motion characterization of MEMS resonators using stroboscopic scanning electron microscopyWong, C.-L.; Wong, W.-K. 
2008Multiwall carbon nanotube resonator for ultra-sensitive mass detectionWu, W. ; Palaniapan, M. ; Wong, W.-K. 
2007Non-destructive functionality and reliability assessment of dynamic MEMS using acoustic phonon characterizationWong, W.-K. ; Wong, C.-L.; Palaniapan, M. ; Tay, F.E.H. 
2006Non-invasive acoustic phonon characterization of dynamic MEMSWong, W.K. ; Palaniapan, M. ; Wong, C.L.; Wang, S.R.; Tay, F.E.H. 
2005Novel acoustic techniques for microelectronic failure analysis and characterizationWong, W.K. ; Street, A.G.
Jul-2006Parameters and mechanisms governing image contrast in scanning electron microscopy of single-walled carbon nanotubesWong, W.K. ; Nojeh, A.; Pease, R.F.W.
2006Phonon-mediated characterization of microelectromechanical resonatorsWong, W.-K. ; Palaniapan, M. 
2001Reduction of charging effects using vector scanning in the scanning electron microscopeThong, J.T.L. ; Lee, K.W.; Wong, W.K. 
5-Jul-2004Scanning electron microscopy of field-emitting individual single-walled carbon nanotubesNojeh, A.; Wong, W.-K. ; Baum, A.W.; Pease, R.F.; Dai, H.
19-Aug-2003Selective deposition of a particle beam based on charging characteristics of a sampleKIN, WONG WAI ; PHANG, JACOB C. H. ; THONG, JOHN 
2001Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscopeWong, W.K. ; Wei, Y.Z.; Phang, J.C.H. ; Thong, J.T.L. 
1995Study of integrated circuits I-V characteristics using a fault localization systems [FLS]Quah, L.T.S.; Wong, W.K. ; Phang, J.C.H. ; Chan, D.S.H. ; Ho, P.Y.S.
Nov-2003Transient temperature measurements of resist heating using nanothermocouplesChu, D.; Wong, W.-K. ; Goodson, K.E.; Pease, R.F.W.