Browsing by Author Wong Wai Kin

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Issue DateTitleAuthor(s)
2006Carbon nanostructures as interconnect and interface materialsDe Asis, E.; Ngo, Q.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
2006Carbon nanotube interconnects in electrical and biological systemsNgo, Q.; De Asis, E.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
2007Carbon-based nanostructures as interconnects in electrical and biological systemsDe Asis, E.; Ngo, Q.; Seger, A.; Wang, L.; Wong, W.K. ; Isaacson, M.S.; Yang, C.Y.
2008Characterization of SOI Lamé-mode square resonatorsKhine, L.; Palaniapan, M. ; Shao, L.; Wong, W.-K. 
1995Charging control using pulsed scanning electron microscopyWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
1997Charging identification and compensation in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
2001Effect of pseudo-random scan parameters on negative specimen charging and beam landing errors in the scanning electron microscopeThong, J.T.L. ; Wong, W.K. ; Zainal, A.
Nov-2004Electron beam stimulated field-emission from single-walled carbon nanotubesNojeh, A.; Wong, W.-K. ; Yieh, E.; Fabian Pease, R.; Dai, H.
Nov-2004Electron-acoustic and surface electron beam induced voltage signal formation in scanning electron microscopy analysis of semiconducting samplesWong, W.K. ; Rau, E.I.; Thong, J.T.L. 
1-Sep-1997Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
Jan-1998Factors governing the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
1995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
1995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
14-May-2006In situ observation of localized metallic nanocrystal growth on carbon nanotube templates in a scanning electron microscopeWong, W.-K. ; Lim, S.-H.; Thong, J.T.L. 
20-Jul-2007In-plane motion characterization of MEMS resonators using stroboscopic scanning electron microscopyWong, C.-L.; Wong, W.-K. 
2008Multiwall carbon nanotube resonator for ultra-sensitive mass detectionWu, W. ; Palaniapan, M. ; Wong, W.-K. 
2007Non-destructive functionality and reliability assessment of dynamic MEMS using acoustic phonon characterizationWong, W.-K. ; Wong, C.-L.; Palaniapan, M. ; Tay, F.E.H. 
2006Non-invasive acoustic phonon characterization of dynamic MEMSWong, W.K. ; Palaniapan, M. ; Wong, C.L.; Wang, S.R.; Tay, F.E.H. 
2005Novel acoustic techniques for microelectronic failure analysis and characterizationWong, W.K. ; Street, A.G.