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	Issue Date	Title	Author(s)
	6-Sep-2017	Modeling tunnel profile in the presence of coordinate errors: A Gaussian process-based approach	Chen Zhang; Yong Lei ; Linmiao Zhang ; Nan Chen
	Oct-2003	Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy Measurements	Chim, W.K. ; Wong, K.M. ; Yeow, Y.T.; Hong, Y.D.; Lei, Y. ; Teo, L.W.; Choi, W.K.
	Apr-2005	Morphology controlled growth of large area ordered porous film	Sun, F.-Q.; Cai, W.-P.; Li, Y.; Cao, B.-Q.; Lei, Y. ; Zhang, L.-D.
	Mar-2004	Morphology-controlled growth of large-area two-dimensional ordered pore arrays	Sun, F.; Cai, W.; Li, Y.; Cao, B.; Lei, Y. ; Zhang, L.
	1-Sep-2005	Ordered arrays of highly oriented single-crystal semiconductor nanoparticles on silicon substrates	Lei, Y. ; Chim, W.K. ; Weissmüller, J.; Wilde, G.; Sun, H.P.; Pan, X.Q.
	21-Oct-2003	Ordered nanoporous nickel films and their magnetic properties	Lei, Y. ; Chim, W.-K. ; Zhang, Z.; Zhou, T.; Zhang, L.; Meng, G.; Phillipp, F.
	8-Feb-2005	Shape and size control of regularly arrayed nanodots fabricated using ultrathin alumina masks	Lei, Y. ; Chim, W.-K.
	4-Nov-2002	Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structure	Teo, L.W.; Choi, W.K. ; Chim, W.K. ; Ho, V.; Moey, C.M.; Tay, M.S.; Heng, C.L. ; Lei, Y. ; Antoniadis, D.A.; Fitzgerald, E.A.

Showing results 6 to 13 of 13 < previous