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Issue Date	Title	Author(s)
1995	Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced current	Lau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
1995	Quantitative imaging of local defects in very thin silicon dioxide films at low bias voltage by true oxide electron-beam-induced current	Lau, W.S. ; Chan, D.S.H. ; Phang, J.C.H. ; Chow, K.W.; Pey, K.S.; Lim, Y.P.; Sane, V. ; Cronquist, B.
1995	Two types of local oxide/substrate defects in very thin silicon dioxide films on silicon	Lau, W.S. ; Sane, V. ; Pey, K.S.; Cronquist, B.

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