Browsing by Author Ng Tuck Wah

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Issue DateTitleAuthor(s)
Jun-1995Improved DSPI configuration for the inspection of components in the production lineNg, T.W. 
1994Improved visual detection of flaws by using temporal phase modulation in digital speckle shearing interferometryNg, T.W. 
1994Improved white-light reconstruction of shearograms for simultaneous measurement of displacement derivativesNg, T.W. ; Leow, C.Y.; Chau, F.S. ; Toh, S.L. 
1995In situ monitoring of object beam expander noise in speckle correlation interferometryNg, T.W. ; Wong, T.H. ; Chau, F.S. 
Oct-2005Inexpensive color evaluation of dye-based pressure-sensitive films for plantar studiesNg, T.W. ; Yeong, W.K.
Jul-1997Light emitting diodes for illumination in photoelasticityNg, T.W. ; Asundi, A. 
15-Dec-1993Limit to sensitivity reduction in shearing speckle interferometry imposed by imaging aberrationsNg, T.W. ; Chau, F.S. 
2005Low-cost precision rotary index calibrationNg, T.W. ; Lim, T.S.
1-Oct-1993Measurement of linear shear in digital shearing speckle interferometryNg, T.W. ; Chau, F.S. 
Mar-2001Measuring the illumination angle of a flatbed scannerNg, T.W. ; Tajuddin, A.
Nov-2004Measuring viscoelastic deformation with an optical mouseNg, T.W. 
May-2002Monitoring building shift using a robust speckle correlation encoder schemeNg, T.W. ; Yong, W.B.
2006Near-field compact dielectric opticsFeuernann, D.; Gordon, J.M.; Ng, T.W. 
Aug-2006Near-field dielectric optics near the thermodynamic limitFeuermann, D.; Gordon, J.M.; Ng, T.W. 
15-Feb-1997Numerical study of effects of pulsatile amplitude on unsteady laminar flows in rigid pipe with ring-type constrictionsLee, T.S. ; Ng, T.W. ; Shi, Z.D.
1-Sep-1994Object illumination angle measurement in speckle interferometryNg, T.W. ; Chau, F.S. 
Mar-1997Optical Distance Sensing Using Digital Speckle Shearing InterferometryNg, T.W. 
Nov-2004Optical evaluation of ingot fixity in semiconductor wafer slicingNg, T.W. ; Nallathamby, R.
Dec-2003Optical sensor for semiconductor chip bondingNg, T.W. ; Ng, C.W.
Jan-2001Optical surface roughness evaluation of phosphorus-doped polysilicon filmsNg, T.W. ; Teo, T.W.; Rajendra, P.