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Issue Date	Title	Author(s)
10-May-2005	Data compression for speckle correlation interferometry temporal fringe pattern analysis	Ng, T.W. ; Ang, K.T.
Aug-1994	Dependence of fringe contrast on phase statistics in speckle correlation interferometry	Ng, T.W. ; Chau, F.S.
1-Apr-1995	Derivation of phase in computer-aided photoelasticity	Ng, T.W.
1997	Derivation of retardation phase in computer-aided photoelasticity by using carrier fringe phase shifting	Ng, T.W.
1993	Determining the optimum image recording conditions in shearography based on spatial frequency considerations	Chau, Fook S. ; Ng, Tuck-Wah
1-Mar-2007	Digital readout manometer using an optical mouse	Ng, T.W. ; Cheong, T.L.; Sheridan, J.
15-Apr-1995	Digital speckle pattern interferometer for combined measurements of out-of-plane displacement and slope	Ng, T.W.
1994	Discrete dynamic resolution considerations in digital speckle correlation interferometry	Ng, T.W. ; Chau, F.S.
Oct-1994	Effect of camera spatial resolution on fringe contrast in digital speckle correlation interferometry	Ng, T.W. ; Chau, F.S.
1998	Electronic digests in scientific communication	Ng, T.W.
Nov-2003	ESPI with structured illumination	Ng, T.W.
1996	Fast derivation of phase in computer-aided photoelasticity	Ng, T.W.
2005	Feasibility of modulated optical deflection sensing in atomic force microscopy	Ng, T.W. ; Lee, W.S.; Sasaki, O.
20-Nov-2005	Fourier-transform method of data compression and temporal fringe pattern analysis	Ng, T.W. ; Ang, K.T.
2005	Gaussian laser beam diameter measurement using a quadrant photodiode	Ng, T.W. ; Foo, S.L.; Tan, H.Y.
Apr-2003	Hard disk wobble detection using optical triangulation and time-delay integrated imaging	Ng, T.W. ; Sin, H.K.
12-Jun-2007	High sensitivity scanning probe system	NG, TUCK WAH ; CHUA, HUI TONG ; SASAKI, OSAMI
16-Jun-2005	HIGH SENSITIVITY SCANNING PROBE SYSTEM	NG, TUCK WAH ; CHUA, HUI TONG ; SASAKI, OSAMI
1996	High-speed phase-shift computation using dynamic memory processing	Ng, T.W.
Jun-1995	Improved DSPI configuration for the inspection of components in the production line	Ng, T.W.

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