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CHIM WAI KIN
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Showing results 184 to 203 of 209
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Issue Date
Title
Author(s)
2008
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
Wong, K.M.
;
Chim, W.K.
;
Huang, J.Q.
;
Zhu, L.
Apr-2000
Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces
Lu, Y.F.
;
Mai, Z.H.
;
Song, W.D.
;
Chim, W.K.
Apr-2000
Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces
Lu, Y.F.
;
Mai, Z.H.
;
Song, W.D.
;
Chim, W.K.
1999
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing
Oh, G.G.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lou, C.L.
1999
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing
Oh, G.G.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lou, C.L.
8-Feb-2005
Shape and size control of regularly arrayed nanodots fabricated using ultrathin alumina masks
Lei, Y.
;
Chim, W.-K.
4-Nov-2002
Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structure
Teo, L.W.
;
Choi, W.K.
;
Chim, W.K.
;
Ho, V.
;
Moey, C.M.
;
Tay, M.S.
;
Heng, C.L.
;
Lei, Y.
;
Antoniadis, D.A.
;
Fitzgerald, E.A.
2007
Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurements
Wong, K.M.
;
Chim, W.K.
;
Ang, K.W.
;
Yeo, Y.C.
14-May-1996
Spectroscopic observations of photon emissions in n-MOSFETs in the saturation region
Tao, J.M.
;
Chan, D.S.H.
;
Chim, W.K.
Jun-1997
Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
Teh, G.L.
;
Chim, W.K.
;
Swee, Y.K.
;
Co, Y.K.
Jun-1997
Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique
Teh, G.L.
;
Chim, W.K.
;
Swee, Y.K.
;
Co, Y.K.
1999
Stress-induced leakage current and lateral nonuniform charge generation in thermal oxides subjected to negative-gate-voltage impulse stressing
Lim, P.S.
;
Chim, W.K.
2001
Stress-induced leakage current in thin oxides under high-field impulse stressing
Tan, Y.N.
;
Chim, W.K.
;
Lim, P.S.
Nov-2001
Structural characterisation of polycrystalline SiGe thin film
Teh, L.K.
;
Choi, W.K.
;
Bera, L.K.
;
Chim, W.K.
2000
Study of implanted boron distribution in p+n structures using scanning capacitance microscopy
Teo, Y.L.
;
Pey, K.L.
;
Chim, W.K.
;
Chong, Y.F.
1999
Study on LED degradation using CL, EBIC and a two-diode parameter extraction model
Xiao, H.
;
Liu, Y.Y.
;
Phang, J.C.H.
;
Chan, D.S.H.
;
Chim, W.K.
;
Yan, K.P.
2007
Synthesis and electronic application of germanium nanocrystals in silicon oxide matrix
Choi, W.K.
;
Chim, W.K.
;
Chew, H.G.
1-Aug-2004
Synthesis of germanium nanodots on silicon using an anodic alumina membrane mask
Chen, Z.
;
Lei, Y.
;
Chew, H.G.
;
Teo, L.W.
;
Choi, W.K.
;
Chim, W.K.
2013
The coloration and degradation mechanisms of electrochromic nickel oxide
Ren, Y.
;
Chim, W.K.
;
Guo, L.
;
Tanoto, H.
;
Pan, J.
;
Chiam, S.Y.
21-Dec-2013
The role of ions and reaction sites for electrochemical reversible charge cycling in mesoporous nickel hydroxides
Liu, J.
;
Ren, Y.
;
Dasgupta, B.
;
Tanoto, H.
;
Seng, H.L.
;
Chim, W.K.
;
Li, S.F.Y.
;
Chiam, S.Y.