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Browsing by Author CHIM WAI KIN

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Showing results 184 to 203 of 209 < previous   next >
Issue DateTitleAuthor(s)
2008Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sitesWong, K.M. ; Chim, W.K. ; Huang, J.Q.; Zhu, L.
Apr-2000Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfacesLu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
Apr-2000Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfacesLu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
1999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
1999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
8-Feb-2005Shape and size control of regularly arrayed nanodots fabricated using ultrathin alumina masksLei, Y. ; Chim, W.-K. 
4-Nov-2002Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structureTeo, L.W.; Choi, W.K. ; Chim, W.K. ; Ho, V.; Moey, C.M.; Tay, M.S.; Heng, C.L. ; Lei, Y. ; Antoniadis, D.A.; Fitzgerald, E.A.
2007Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurementsWong, K.M. ; Chim, W.K. ; Ang, K.W.; Yeo, Y.C. 
14-May-1996Spectroscopic observations of photon emissions in n-MOSFETs in the saturation regionTao, J.M. ; Chan, D.S.H. ; Chim, W.K. 
Jun-1997Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line techniqueTeh, G.L.; Chim, W.K. ; Swee, Y.K.; Co, Y.K.
Jun-1997Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line techniqueTeh, G.L.; Chim, W.K. ; Swee, Y.K.; Co, Y.K.
1999Stress-induced leakage current and lateral nonuniform charge generation in thermal oxides subjected to negative-gate-voltage impulse stressingLim, P.S.; Chim, W.K. 
2001Stress-induced leakage current in thin oxides under high-field impulse stressingTan, Y.N.; Chim, W.K. ; Lim, P.S.
Nov-2001Structural characterisation of polycrystalline SiGe thin filmTeh, L.K.; Choi, W.K. ; Bera, L.K. ; Chim, W.K. 
2000Study of implanted boron distribution in p+n structures using scanning capacitance microscopyTeo, Y.L.; Pey, K.L. ; Chim, W.K. ; Chong, Y.F.
1999Study on LED degradation using CL, EBIC and a two-diode parameter extraction modelXiao, H.; Liu, Y.Y.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. ; Yan, K.P.
2007Synthesis and electronic application of germanium nanocrystals in silicon oxide matrixChoi, W.K. ; Chim, W.K. ; Chew, H.G.
1-Aug-2004Synthesis of germanium nanodots on silicon using an anodic alumina membrane maskChen, Z.; Lei, Y.; Chew, H.G.; Teo, L.W.; Choi, W.K. ; Chim, W.K. 
2013The coloration and degradation mechanisms of electrochromic nickel oxideRen, Y.; Chim, W.K. ; Guo, L.; Tanoto, H.; Pan, J.; Chiam, S.Y.
21-Dec-2013The role of ions and reaction sites for electrochemical reversible charge cycling in mesoporous nickel hydroxidesLiu, J.; Ren, Y.; Dasgupta, B.; Tanoto, H.; Seng, H.L.; Chim, W.K. ; Li, S.F.Y. ; Chiam, S.Y.
Showing results 184 to 203 of 209 < previous   next >