Browsing by Author CHIM WAI KIN

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Issue DateTitleAuthor(s)
Jan-2001Random telegraphic signals and low-frequency noise in rapid-thermal-annealed silicon-silicon oxide structuresChim, W.K. ; Leong, K.K.; Choi, W.K. 
15-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
15-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
29-Oct-1996Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimensPHANG, J. C. H. ; CBIM, W. K. ; CHAN, D. S. H. ; LIU, Y. Y. 
10-Jan-2011Role of oxygen for highly conducting and transparent gallium-doped zinc oxide electrode deposited at room temperatureWong, L.M.; Chiam, S.Y.; Huang, J.Q.; Wang, S.J.; Pan, J.S.; Chim, W.K. 
2008Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sitesWong, K.M. ; Chim, W.K. ; Huang, J.Q.; Zhu, L.
Apr-2000Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfacesLu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
Apr-2000Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfacesLu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
1999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
1999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
8-Feb-2005Shape and size control of regularly arrayed nanodots fabricated using ultrathin alumina masksLei, Y. ; Chim, W.-K. 
4-Nov-2002Size control and charge storage mechanism of germanium nanocrystals in a metal-insulator-semiconductor structureTeo, L.W.; Choi, W.K. ; Chim, W.K. ; Ho, V.; Moey, C.M.; Tay, M.S.; Heng, C.L. ; Lei, Y. ; Antoniadis, D.A.; Fitzgerald, E.A.
2007Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurementsWong, K.M. ; Chim, W.K. ; Ang, K.W.; Yeo, Y.C. 
14-May-1996Spectroscopic observations of photon emissions in n-MOSFETs in the saturation regionTao, J.M. ; Chan, D.S.H. ; Chim, W.K. 
Jun-1997Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line techniqueTeh, G.L.; Chim, W.K. ; Swee, Y.K.; Co, Y.K.
Jun-1997Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line techniqueTeh, G.L.; Chim, W.K. ; Swee, Y.K.; Co, Y.K.
1999Stress-induced leakage current and lateral nonuniform charge generation in thermal oxides subjected to negative-gate-voltage impulse stressingLim, P.S.; Chim, W.K. 
2001Stress-induced leakage current in thin oxides under high-field impulse stressingTan, Y.N.; Chim, W.K. ; Lim, P.S.
Nov-2001Structural characterisation of polycrystalline SiGe thin filmTeh, L.K.; Choi, W.K. ; Bera, L.K. ; Chim, W.K. 
2000Study of implanted boron distribution in p+n structures using scanning capacitance microscopyTeo, Y.L.; Pey, K.L. ; Chim, W.K. ; Chong, Y.F.