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CHIM WAI KIN
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Showing results 170 to 189 of 209
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Issue Date
Title
Author(s)
2005
Physical mechanism of oxide interfacial traps, carrier mobility degradation and series resistance on contrast reversal in scanning-capacitance-microscopy dopant concentration extraction
Wong, K.M.
;
Chim, W.K.
;
Yan, J.
1997
Post-stress dual-trap interaction in hot-carrier stressed submicrometer n-channel metal-oxide-semiconductor field-effect-transistors
Chim, W.K.
;
Chua, T.J.
1997
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
Teh, G.L.
;
Chim, W.K.
1997
Pre-breakdown charge trapping in ESD stressed thin MOS gate oxides
Teh, G.L.
;
Chim, W.K.
2000
Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devices
Lai, K.-K.
;
Lim, P.-S.
;
Chim, W.-K.
;
Pan, Y.
2000
Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devices
Lai, K.-K.
;
Lim, P.-S.
;
Chim, W.-K.
;
Pan, Y.
21-Jul-1999
Properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrate
Liu, X.
;
Phang, J.C.H.
;
Chan, D.S.H.
;
Chim, W.K.
2002
Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectric
Koh, B.H.
;
Ng, T.H.
;
Zheng, J.X.
;
Chim, W.K.
;
Choi, W.K.
1-May-2004
Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory application
Koh, B.H.
;
Chim, W.K.
;
Ng, T.H.
;
Zheng, J.X.
;
Choi, W.K.
Jan-2001
Random telegraphic signals and low-frequency noise in rapid-thermal-annealed silicon-silicon oxide structures
Chim, W.K.
;
Leong, K.K.
;
Choi, W.K.
15-Mar-2000
Random telegraphic signals in rapid thermal annealed silicon-silicon oxide system
Chim, W.K.
;
Choi, W.K.
;
Leong, K.K.
;
Teh, L.K.
15-Mar-2000
Random telegraphic signals in rapid thermal annealed silicon-silicon oxide system
Chim, W.K.
;
Choi, W.K.
;
Leong, K.K.
;
Teh, L.K.
29-Oct-1996
Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimens
PHANG, J. C. H.
;
CBIM, W. K.
;
CHAN, D. S. H.
;
LIU, Y. Y.
10-Jan-2011
Role of oxygen for highly conducting and transparent gallium-doped zinc oxide electrode deposited at room temperature
Wong, L.M.
;
Chiam, S.Y.
;
Huang, J.Q.
;
Wang, S.J.
;
Pan, J.S.
;
Chim, W.K.
2008
Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sites
Wong, K.M.
;
Chim, W.K.
;
Huang, J.Q.
;
Zhu, L.
Apr-2000
Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces
Lu, Y.F.
;
Mai, Z.H.
;
Song, W.D.
;
Chim, W.K.
Apr-2000
Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfaces
Lu, Y.F.
;
Mai, Z.H.
;
Song, W.D.
;
Chim, W.K.
1999
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing
Oh, G.G.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lou, C.L.
1999
Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressing
Oh, G.G.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lou, C.L.
8-Feb-2005
Shape and size control of regularly arrayed nanodots fabricated using ultrathin alumina masks
Lei, Y.
;
Chim, W.-K.