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Browsing by Author CHIM WAI KIN

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Showing results 170 to 189 of 209 < previous   next >
Issue DateTitleAuthor(s)
2005Physical mechanism of oxide interfacial traps, carrier mobility degradation and series resistance on contrast reversal in scanning-capacitance-microscopy dopant concentration extractionWong, K.M. ; Chim, W.K. ; Yan, J.
1997Post-stress dual-trap interaction in hot-carrier stressed submicrometer n-channel metal-oxide-semiconductor field-effect-transistorsChim, W.K. ; Chua, T.J.
1997Pre-breakdown charge trapping in ESD stressed thin MOS gate oxidesTeh, G.L.; Chim, W.K. 
1997Pre-breakdown charge trapping in ESD stressed thin MOS gate oxidesTeh, G.L.; Chim, W.K. 
2000Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devicesLai, K.-K.; Lim, P.-S.; Chim, W.-K. ; Pan, Y.
2000Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devicesLai, K.-K.; Lim, P.-S.; Chim, W.-K. ; Pan, Y.
21-Jul-1999Properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrateLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
2002Quantum mechanical modeling of capacitance and gate current for MIS structures using zirconium dioxide as the gate dielectricKoh, B.H.; Ng, T.H.; Zheng, J.X.; Chim, W.K. ; Choi, W.K. 
1-May-2004Quantum mechanical modeling of gate capacitance and gate current in tunnel dielectric stack structures for nonvolatile memory applicationKoh, B.H.; Chim, W.K. ; Ng, T.H.; Zheng, J.X.; Choi, W.K. 
Jan-2001Random telegraphic signals and low-frequency noise in rapid-thermal-annealed silicon-silicon oxide structuresChim, W.K. ; Leong, K.K.; Choi, W.K. 
15-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
15-Mar-2000Random telegraphic signals in rapid thermal annealed silicon-silicon oxide systemChim, W.K. ; Choi, W.K. ; Leong, K.K.; Teh, L.K.
29-Oct-1996Retractable cathodoluminescence detector with high ellipticity and high backscattered electron rejection performance for large area specimensPHANG, J. C. H. ; CBIM, W. K. ; CHAN, D. S. H. ; LIU, Y. Y. 
10-Jan-2011Role of oxygen for highly conducting and transparent gallium-doped zinc oxide electrode deposited at room temperatureWong, L.M.; Chiam, S.Y.; Huang, J.Q.; Wang, S.J.; Pan, J.S.; Chim, W.K. 
2008Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sitesWong, K.M. ; Chim, W.K. ; Huang, J.Q.; Zhu, L.
Apr-2000Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfacesLu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
Apr-2000Scanning tunnelling microscopy imaging and modification of hydrogen-passivated Ge(100) surfacesLu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
1999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
1999Series resistance and effective channel mobility degradation in LDD NMOSFETs under hot-carrier stressingOh, G.G.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
8-Feb-2005Shape and size control of regularly arrayed nanodots fabricated using ultrathin alumina masksLei, Y. ; Chim, W.-K. 
Showing results 170 to 189 of 209 < previous   next >