Browsing by Author CHIM WAI KIN

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Issue DateTitleAuthor(s)
1999Nanolithography by tip-enhanced laser irradiationMai, Z.H.; Lu, Y.F. ; Song, W.D. ; Chim, W.K. 
1999Nanolithography by tip-enhanced laser irradiationMai, Z.H.; Lu, Y.F. ; Song, W.D. ; Chim, W.K. 
2006Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles studyZheng, J.X.; Ceder, G.; Maxisch, T.; Chim, W.K. ; Choi, W.K. 
Apr-1998Neutral electron trap generation and hole trapping in thin oxides under electrostatic discharge stressChim, W.K. ; Teh, G.L.
Apr-1998Neutral electron trap generation and hole trapping in thin oxides under electrostatic discharge stressChim, W.K. ; Teh, G.L.
1999New DC voltage-voltage method to measure the interface traps in deep sub-micron MOS transistorsJie, B.B.; Li, M.F. ; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
1997New method for the localization of metallization defects using cathodoluminescence imagingLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
1996New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETsLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
1996New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETsLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
1995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
1995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
1997Numerical prediction of etched profile in pyrolytic laser etchingWee, T.S. ; Lu, Y.F. ; Chim, W.K. 
Aug-1997Numerical prediction of the etched profile in pyrolytic laser etching of silicon and gallium arsenideWee, T.-S.; Lu, Y.-F. ; Chim, W.-K. 
18-Mar-2002Observation of memory effect in germanium nanocrystals embedded in an amorphous silicon oxide matrix of a metal-insulator-semiconductor structureChoi, W.K. ; Chim, W.K. ; Heng, C.L.; Teo, L.W.; Ho, V.; Ng, V. ; Antoniadis, D.A.; Fitzgerald, E.A.
Jul-1994Optoelectronic material analysis and device failure analysis using SEM cathodoluminescencePey, K.L. ; Chim, W.K. ; Phang, J.C.H. ; Chan, D.S.H. 
1-Sep-2005Ordered arrays of highly oriented single-crystal semiconductor nanoparticles on silicon substratesLei, Y. ; Chim, W.K. ; Weissmüller, J.; Wilde, G.; Sun, H.P.; Pan, X.Q.
21-Oct-2003Ordered nanoporous nickel films and their magnetic propertiesLei, Y. ; Chim, W.-K. ; Zhang, Z.; Zhou, T.; Zhang, L.; Meng, G.; Phillipp, F.
15-Mar-2004Origin of charge trapping in germanium nanocrystal embedded SiO 2 system: Role of interfacial traps?Kan, E.W.H.; Choi, W.K. ; Chim, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.
Jul-2004Over-erase phenomenon in SONOS-type flash memory and its minimization using a hafnium oxide charge storage layerTan, Y.-N.; Chim, W.-K. ; Cho, B.J. ; Choi, W.-K. 
2005Physical mechanism of oxide interfacial traps, carrier mobility degradation and series resistance on contrast reversal in scanning-capacitance-microscopy dopant concentration extractionWong, K.M. ; Chim, W.K. ; Yan, J.