Browsing by Author CHIM WAI KIN

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Issue DateTitleAuthor(s)
2000Kinetic study of nanofabrication on gold films by atomic force microscope tips under laser irradiationHu, B.; Lu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
2000Kinetic study of nanofabrication on gold films by atomic force microscope tips under laser irradiationHu, B.; Lu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
13-Jul-2004Large-scale ordered carbon nanotube arrays initiated from highly ordered catalyst arrays on silicon substratesLei, Y. ; Yeong, K.-S.; Thong, J.T.L. ; Chim, W.-K. 
18-Oct-1999Laser-induced nano-oxidation on hydrogen-passivated Ge (100) surfaces under a scanning tunneling microscope tipLu, Y.F. ; Mai, Z.H.; Qiu, G.; Chim, W.K. 
18-Oct-1999Laser-induced nano-oxidation on hydrogen-passivated Ge (100) surfaces under a scanning tunneling microscope tipLu, Y.F. ; Mai, Z.H.; Qiu, G.; Chim, W.K. 
Dec-2001Latent damage generation in thin oxides of metal-oxide-semiconductor devices under high-field impulse stress and damage characterization using low-frequency noise measurementChim, W.K. ; Lim, P.S.
1999Latent damage investigation on lateral non-uniform charge generation and stress-induced leakage current in silicon dioxides subjected to low-level electrostatic discharge impulse stressingLim, P.S.; Chim, W.K. 
2000Latent damage investigation on lateral nonuniform charge generation and stress-induced leakage current in silicon dioxide subjected to high-field current impulse stressingChim, W.-K. 
2000Latent damage investigation on lateral nonuniform charge generation and stress-induced leakage current in silicon dioxide subjected to high-field current impulse stressingChim, W.-K. 
Oct-1998Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressingChim, W.K. ; Yeo, B.P.; Lim, P.S.; Chan, D.S.H. 
Oct-1998Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressingChim, W.K. ; Yeo, B.P.; Lim, P.S.; Chan, D.S.H. 
2002Manipulation of germanium nanocrystals in a tri-layer insulator structure of a metal-insulator-semiconductor memory deviceTeo, L.W.; Heng, C.L. ; Ho, V.; Tay, M.; Choi, W.K. ; Chim, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.
2000Mechanism of laser-induced nanomodification on hydrogen-passivated Si(100) surfaces underneath the tip of a scanning tunneling microscopeMai, Z.H.; Lu, Y.F. ; Huang, S.M.; Chim, W.K. ; Pan, J.S. 
23-Jan-1996Method and apparatus for measuring quantitative voltage contrastCHIM, WAI K. ; PHANG, JACOB C. H. ; CHAN, DANIEL S. H. 
1-Jan-2002Microstructural characterization of rf sputtered polycrystalline silicon germanium filmsChoi, W.K. ; Teh, L.K.; Bera, L.K. ; Chim, W.K. ; Wee, A.T.S. ; Jie, Y.X. 
31-May-2004Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectricNg, T.H.; Chim, W.K. ; Choi, W.K. ; Ho, V.; Teo, L.W.; Du, A.Y.; Tung, C.H.
15-Oct-2003Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxideChim, W.K. ; Zheng, J.X.; Koh, B.H.
1-Dec-2002Modeling the trap generation and relaxation effects in thin oxides under unipolar and bipolar high-field impulse stressing using stress-induced leakage currentChim, W.K. ; Tan, Y.N.
Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.