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Browsing by Author CHIM WAI KIN

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Showing results 107 to 126 of 209 < previous   next >
Issue DateTitleAuthor(s)
1-Feb-2002Improved model for the stress-induced leakage current in thin silicon dioxide based on conduction-band electron and valence-band electron tunnelingChim, W.K. ; Lim, P.S.
20-May-2003Incorporation of dielectric layer onto SThM tips for direct thermal analysisHU, CHANG CHAUN; PEY, KIN LEONG ; CHONG, YUNG FU; KIN, CHIM WAI ; NEUZIL, PAVEL; CHAN, LAP
Sep-2004Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurementHong, Y.D.; Yeow, Y.T.; Chim, W.-K. ; Wong, K.-M. ; Kopanski, J.J.
14-Feb-2007Influence of reductant and germanium concentration on the growth and stress development of germanium nanocrystals in silicon oxide matrixChew, H.G.; Zheng, F.; Choi, W.K. ; Chim, W.K. ; Foo, Y.L.; Fitzgerald, E.A.
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
1999Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysisNg, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. 
3-Mar-1998Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mappingCHIM, WAI KIN ; CHAN, DANIEL SIU HUNG ; PHANG, JACOB CHEE HONG ; TAO, JING MEI ; LIU, YONG YU 
15-Apr-2003Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal-insulator-semiconductor structures and current transport mechanismsChim, W.K. ; Ng, T.H.; Koh, B.H.; Choi, W.K. ; Zheng, J.X.; Tung, C.H.; Du, A.Y.
Nov-2012Interfacial-layer-free growth of yttrium oxide on germanium by understanding initial surface reactionsLiu, Z.Q.; Chim, W.K. ; Chiam, S.Y.; Pan, J.S.; Chun, S.R.; Liu, Q.; Ng, C.M.
2010Investigation of bipolar resistive switching and the time-dependent SET process in silver sulfide/silver thin films and nanowire array structuresPi, C.; Ren, Y.; Chim, W.K. 
Dec-1997Investigation of interface traps in LDD pMOST's by the DCIV methodJie, B.B.; Li, M.F. ; Lou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
Dec-1997Investigation of interface traps in LDD pMOST's by the DCIV methodJie, B.B.; Li, M.F. ; Lou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Lo, K.F.
2006Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopyChiam, S.Y.; Chim, W.K. ; Huan, A.C.H.; Pan, J.S.; Zhang, J.
Apr-1994Investigation of some aspects of the liquid crystal optical voltage contrast technique for integrated circuit physical analysisChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. 
Sep-1998Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurementsChan, D.S.H. ; Leang, S.E.; Chim, W.K. 
Sep-1998Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurementsChan, D.S.H. ; Leang, S.E.; Chim, W.K. 
2000Investigation on laser-induced effects in nanostructure fabrication with laser-irradiated scanning tunneling microscope tips in air ambientMai, Z.H.; Lu, Y.F. ; Song, W.D. ; Chim, W.K. 
2000Investigation on laser-induced effects in nanostructure fabrication with laser-irradiated scanning tunneling microscope tips in air ambientMai, Z.H.; Lu, Y.F. ; Song, W.D. ; Chim, W.K. 
2000Kinetic study of nanofabrication on gold films by atomic force microscope tips under laser irradiationHu, B.; Lu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
2000Kinetic study of nanofabrication on gold films by atomic force microscope tips under laser irradiationHu, B.; Lu, Y.F. ; Mai, Z.H.; Song, W.D. ; Chim, W.K. 
Showing results 107 to 126 of 209 < previous   next >