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CHIM WAI KIN
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Showing results 107 to 126 of 209
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Issue Date
Title
Author(s)
1-Feb-2002
Improved model for the stress-induced leakage current in thin silicon dioxide based on conduction-band electron and valence-band electron tunneling
Chim, W.K.
;
Lim, P.S.
20-May-2003
Incorporation of dielectric layer onto SThM tips for direct thermal analysis
HU, CHANG CHAUN
;
PEY, KIN LEONG
;
CHONG, YUNG FU
;
KIN, CHIM WAI
;
NEUZIL, PAVEL
;
CHAN, LAP
Sep-2004
Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurement
Hong, Y.D.
;
Yeow, Y.T.
;
Chim, W.-K.
;
Wong, K.-M.
;
Kopanski, J.J.
14-Feb-2007
Influence of reductant and germanium concentration on the growth and stress development of germanium nanocrystals in silicon oxide matrix
Chew, H.G.
;
Zheng, F.
;
Choi, W.K.
;
Chim, W.K.
;
Foo, Y.L.
;
Fitzgerald, E.A.
1999
Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
Ng, T.H.
;
Chim, W.K.
;
Chan, D.S.H.
;
Phang, J.C.H.
;
Liu, Y.Y.
;
Lou, C.L.
;
Leang, S.E.
;
Tao, J.M.
1999
Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis
Ng, T.H.
;
Chim, W.K.
;
Chan, D.S.H.
;
Phang, J.C.H.
;
Liu, Y.Y.
;
Lou, C.L.
;
Leang, S.E.
;
Tao, J.M.
3-Mar-1998
Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping
CHIM, WAI KIN
;
CHAN, DANIEL SIU HUNG
;
PHANG, JACOB CHEE HONG
;
TAO, JING MEI
;
LIU, YONG YU
15-Apr-2003
Interfacial and bulk properties of zirconium dioxide as a gate dielectric in metal-insulator-semiconductor structures and current transport mechanisms
Chim, W.K.
;
Ng, T.H.
;
Koh, B.H.
;
Choi, W.K.
;
Zheng, J.X.
;
Tung, C.H.
;
Du, A.Y.
Nov-2012
Interfacial-layer-free growth of yttrium oxide on germanium by understanding initial surface reactions
Liu, Z.Q.
;
Chim, W.K.
;
Chiam, S.Y.
;
Pan, J.S.
;
Chun, S.R.
;
Liu, Q.
;
Ng, C.M.
2010
Investigation of bipolar resistive switching and the time-dependent SET process in silver sulfide/silver thin films and nanowire array structures
Pi, C.
;
Ren, Y.
;
Chim, W.K.
Dec-1997
Investigation of interface traps in LDD pMOST's by the DCIV method
Jie, B.B.
;
Li, M.F.
;
Lou, C.L.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lo, K.F.
Dec-1997
Investigation of interface traps in LDD pMOST's by the DCIV method
Jie, B.B.
;
Li, M.F.
;
Lou, C.L.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lo, K.F.
2006
Investigation of silicon diffusion into yttrium using x-ray photoelectron spectroscopy
Chiam, S.Y.
;
Chim, W.K.
;
Huan, A.C.H.
;
Pan, J.S.
;
Zhang, J.
Apr-1994
Investigation of some aspects of the liquid crystal optical voltage contrast technique for integrated circuit physical analysis
Chim, W.K.
;
Chan, D.S.H.
;
Phang, J.C.H.
Sep-1998
Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurements
Chan, D.S.H.
;
Leang, S.E.
;
Chim, W.K.
Sep-1998
Investigation of the role of hot holes and hot electrons in the generation of interface states in submicrometre MOSFETs using a new charge-profiling technique based on charge-pumping measurements
Chan, D.S.H.
;
Leang, S.E.
;
Chim, W.K.
2000
Investigation on laser-induced effects in nanostructure fabrication with laser-irradiated scanning tunneling microscope tips in air ambient
Mai, Z.H.
;
Lu, Y.F.
;
Song, W.D.
;
Chim, W.K.
2000
Investigation on laser-induced effects in nanostructure fabrication with laser-irradiated scanning tunneling microscope tips in air ambient
Mai, Z.H.
;
Lu, Y.F.
;
Song, W.D.
;
Chim, W.K.
2000
Kinetic study of nanofabrication on gold films by atomic force microscope tips under laser irradiation
Hu, B.
;
Lu, Y.F.
;
Mai, Z.H.
;
Song, W.D.
;
Chim, W.K.
2000
Kinetic study of nanofabrication on gold films by atomic force microscope tips under laser irradiation
Hu, B.
;
Lu, Y.F.
;
Mai, Z.H.
;
Song, W.D.
;
Chim, W.K.