Browsing by Author CHIM WAI KIN

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Issue DateTitleAuthor(s)
Apr-2006Hafnium aluminum oxide as charge storage and blocking-oxide layers in SONOS-type nonvolatile memory for high-speed operationTan, Y.N.; Chim, W.K. ; Choi, W.K. ; Joo, M.S. ; Cho, B.J. 
2009Heterostructures of germanium nanowires and germanium-silicon oxide nanotubes and growth mechanismsHuang, J.Q.; Chiam, S.Y.; Chim, W.K. ; Wong, L.M.; Wang, S.J.
2004High-K HfAlO charge trapping layer in SONOS-type nonvolatile memory device for high speed operationTan, Y.N.; Chim, W.K. ; Choi, W.K. ; Joo, M.S. ; Ng, T.H.; Cho, B.J. 
14-Oct-2002High-resolution atomic force microscope nanotip grown by self-field emissionOon, C.H.; Thong, J.T.L. ; Lei, Y. ; Chim, W.K. 
1996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
1996High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capabilityTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
10-May-2006High-thermal-stability (HfO2)1-x(Al2O 3)x film fabricated by dual-beam laser ablationLi, Q.; Wang, S.J.; Ng, T.H.; Chim, W.K. ; Huan, A.C.H.; Ong, C.K. 
2006High-thermal-stability (HfO2)1-x(Al2O3)xfilm fabricated by dual-beam laser ablationLi, Q. ; Ong, C.K. ; Wang, S.J.; Huan, A.C.H.; Ng, T.H. ; Chim, W.K. 
31-Oct-2013Highly conductive and transparent aluminum-doped zinc oxide thin films deposited on polyethylene terephthalate substrates by pulsed laser depositionWong, L.M.; Chiam, S.Y.; Chim, W.K. ; Pan, J.S.; Wang, S.J.
9-Feb-2005Highly ordered arrays of metal/semiconductor core-shell nanoparticles with tunable nanostructures and photoluminescenceLei, Y. ; Chim, W.-K. 
7-Mar-2005Highly ordered CdS nanoparticle arrays on silicon substrates and photoluminescence propertiesLei, Y.; Chim, W.K. ; Sun, H.P.; Wilde, G.
1-Feb-2002Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (Chim, W.K. ; Lim, P.S.
1-Feb-2002Hole injection with limited charge relaxation, lateral nonuniform hole trapping, and transient stress-induced leakage current in impulse-stressed thin (&lt;5nm) nitrided oxidesChim, W.K. ; Lim, P.S.
Mar-2000Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structureYue, J.M.P.; Chim, W.K. ; Cho, B.J. ; Chan, D.S.H. ; Qin, W.H.; Kim, Y.-B.; Jang, S.-A.; Yeo, I.-S.
Mar-2000Hot-carrier degradation mechanism in narrow- and wide-channel n-MOSFET's with recessed LOCOS isolation structureYue, J.M.P.; Chim, W.K. ; Cho, B.J. ; Chan, D.S.H. ; Qin, W.H.; Kim, Y.-B.; Jang, S.-A.; Yeo, I.-S.
1995Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETsLou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y. 
1995Hot-carrier induced degradation in the subthreshold characteristics of LDD PMOSFETsLou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y. 
Oct-1996Hot-carrier induced degradation of polysilicon and tungsten polycide gate MOSFETs under maximum substrate and gate current stressesLou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.
2002Hot-carrier lifetime dependence on channel width and silicon recess depth in n-channel metal-oxide-semiconductor field-effect-transistors with the recessed local oxidation of silicon isolation structureChim, W.K. ; Cho, B.J. ; Yue, J.M.P.
Nov-1996Hot-carrier reliability of n- and p-channel MOSFETs with polysilicon and CVD tungsten-polycide gateLou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.