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Issue DateTitleAuthor(s)
8-Sep-2003Effect of annealing profile on defect annihilation, crystallinity and size distribution of germanium nanodots in silicon oxide matrixKan, E.W.H.; Choi, W.K. ; Leoy, C.C.; Chim, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.
28-Apr-2006Effect of germanium concentration and oxide diffusion barrier on the formation and distribution of germanium nanocrystals in silicon oxide matrixChew, H.G.; Choi, W.K. ; Foo, Y.L.; Zheng, F.; Chim, W.K. ; Voon, Z.J.; Seow, K.C.; Fitzgerald, E.A.; Lai, D.M.Y.
27-Oct-2003Effect of germanium concentration and tunnel oxide thickness on nanocrystal formation and charge storage/retention characteristics of a trilayer memory structureHo, V.; Teo, L.W.; Choi, W.K. ; Chim, W.K. ; Tay, M.S.; Antoniadis, D.A.; Fitzgerald, E.A.; Du, A.Y.; Tung, C.H.; Liu, R. ; Wee, A.T.S. 
2001Effect of transmission line pulsing of interconnects investigated using combined low-frequency noise and resistance measurementsChu, L.W.; Chim, W.K. ; Pey, K.L. ; See, A. 
1997Effective channel mobility and series resistance extraction for fresh and hot-carrier stressed graded junction MOSFETs using a single deviceLou, C.L.; Tan, C.B.; Chim, W.K. ; Chan, D.S.H. 
2008Effects of annealing on the valence band offsets between hafnium aluminate and siliconChiam, S.Y.; Chim, W.K. ; Ren, Y.; Pi, C.; Pan, J.S.; Huan, A.C.H.; Wang, S.J.; Zhang, J.
Aug-2012Effects of electric field in band alignment measurements using photoelectron spectroscopyChiam, S.Y.; Liu, Z.Q.; Pan, J.S.; Manippady, K.K.; Wong, L.M.; Chim, W.K. 
1-Oct-2000Effects of high current conduction in sub-micron Ti-silicided filmsGan, C.L.; Pey, K.L. ; Chim, W.K. ; Siah, S.Y.
Apr-2003Effects of rapid thermal annealing time and ambient temperature on the charge storage capability of SiO2/pure Ge/rapid thermal oxide memory structureHeng, C.L.; Teo, L.W.; Ho, V.; Tay, M.S.; Lei, Y.; Choi, W.K. ; Chim, W.K. 
2009Effects of thermal annealing on the band alignment of lanthanum aluminate on silicon investigated by x-ray photoelectron spectroscopyLiu, Z.Q.; Chiam, S.Y.; Chim, W.K. ; Pan, J.S.; Ng, C.M.
1999Electrical and structural properties of rapid thermal annealed RF sputtered silicon oxide filmsChoi, W.K. ; Han, K.K.; Chim, W.K. 
Apr-2003Electrical characterization of a trilayer germanium nanocrystal memory deviceHo, V.; Tay, M.S.; Moey, C.H.; Teo, L.W.; Choi, W.K. ; Chim, W.K. ; Heng, C.L.; Lei, Y.
Oct-1999Electromagnetic calculations of the near field of a tip under polarized laser irradiationLu, Y.-F. ; Mai, Z.-H.; Chim, W.-K. 
1-Jan-1988ELECTRON TRAJECTORY TRACKING ALGORITHMS FOR ANALYSING VOLTAGE CONTRAST SIGNALS IN THE SCANNING ELECTRON MICROSCOPE.Chim, W.K. ; Low, T.S. ; Chan, D.S.H. ; Phang, J.C.H. 
2009Erratum: "band alignment of yttrium oxide on various relaxed and strained semiconductor substrates" (J. Appl. Phys. (2008) 103 (083702))Chiam, S.Y.; Chim, W.K. 
Jun-1991Error voltage components in quantitative voltage contrast measurement systemsChan, D.S.H. ; Low, T.S. ; Chim, W.K. ; Phang, J.C.H. 
2000Estimation of the area of voids in deep-submicron aluminium interconnects using resistance-noise measurementsChu, L.W.; Pey, K.L. ; Chim, W.K. ; Loh, S.K.; Er, E.
1-Nov-2011Evaluating the use of electronegativity in band alignment models through the experimental slope parameter of lanthanum aluminate heterostructuresLiu, Z.Q.; Chim, W.K. ; Chiam, S.Y.; Pan, J.S.; Ng, C.M.
1998Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescenceLiu, X.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. 
Aug-2011Examining the transparency of gallium-doped zinc oxide for photovoltaic applicationsWong, L.M.; Chiam, S.Y.; Huang, J.Q.; Wang, S.J.; Chim, W.K. ; Pan, J.S.