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CHIM WAI KIN
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Showing results 1 to 20 of 209
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Issue Date
Title
Author(s)
2004
A MONOS-type flash memory using a high-k HfAlO charge trapping layer
Tan, Y.N.
;
Chim, W.K.
;
Cho, B.J.
;
Choi, W.K.
Jun-1996
A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope
Chim, W.K.
Jul-1997
A new DC drain-current-conductance method (DCCM) for the characterization of effective mobilty (ueff) and series resistances (Rs, Rd) of fresh and hot-carrier stressed graded junction MOSFET's
Lou, C.L.
;
Chim, W.K.
;
Chan, D.S.H.
;
Pan, Y.
Oct-1995
A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETs
Leang, S.E.
;
Chim, W.K.
;
Chan, D.S.H.
1995
A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope
Chim, W.K.
Mar-2006
Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement
Hong, Y.D.
;
Yeow, Y.T.
;
Chim, W.K.
;
Yan, J.
;
Wong, K.M.
1-May-2011
Ambiguity in the magnitude and direction of the derived interface dipole in lanthanum aluminate heterostructures: Implications and proposed solution
Liu, Z.Q.
;
Chim, W.K.
;
Chiam, S.Y.
;
Pan, J.S.
;
Ng, C.M.
1994
An analytical model for scanning electron microscope Type I magnetic contrast with energy filtering
Chim, W.K.
1-Nov-1997
An analytical model for Type I magnetic contrast enhancement with sample tilting
Chim, W.K.
Jun-1995
An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes
Pey, K.L.
;
Chim, W.K.
;
Koh, L.S.
;
Liu, Y.Y.
;
Chew, S.Y.C.
Jun-1993
An energy dependent model for type I magnetic contrast in the scanning electron microscope
Chim, W.K.
;
Chan, D.S.H.
;
Phang, J.C.H.
;
Low, T.S.
;
Thirumalai, S.
1999
An improved drain-current-conductance method with substrate back-biasing
Tan, C.B.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lou, C.L.
14-Sep-2012
An interface dipole predictive model for high-k dielectric/semiconductor heterostructures using the concept of the dipole neutrality point
Liu, Z.Q.
;
Chim, W.K.
;
Chiam, S.Y.
;
Pan, J.S.
;
Ng, C.M.
1997
Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope
Tao, J.M.
;
Chim, W.K.
;
Chan, D.S.H.
;
Phang, J.C.H.
;
Liu, Y.Y.
May-2001
Analysis of the DCIV peaks in electrically stressed pMOSFETs
Jie, B.B.
;
Chim, W.K.
;
Li, M.-F.
;
Lo, K.F.
23-Oct-2000
Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing
Lim, P.S.
;
Chim, W.K.
Sep-1995
Atomic and magnetic force microscopy imaging of thin-film recording heads
Chim, W.K.
2008
Band alignment of yttrium oxide on various relaxed and strained semiconductor substrates
Chiam, S.Y.
;
Chim, W.K.
;
Pi, C.
;
Huan, A.C.H.
;
Wang, S.J.
;
Pan, J.S.
;
Turner, S.
;
Zhang, J.
1-May-2013
Band gap, band offsets and dielectric constant improvement by addition of yttrium into lanthanum aluminate
Liu, Z.Q.
;
Chim, W.K.
;
Chiam, S.Y.
;
Pan, J.S.
;
Ng, C.M.
Mar-1994
Building-in reliability for silver die attached light emitting diodes
Chim, W.K.
;
Chong, K.Y.