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Issue Date	Title	Author(s)
2004	A MONOS-type flash memory using a high-k HfAlO charge trapping layer	Tan, Y.N.; Chim, W.K. ; Cho, B.J. ; Choi, W.K.
Jun-1996	A neural-network-based local-field-effect correction scheme for quantitative voltage contrast measurements in the scanning electron microscope	Chim, W.K.
Jul-1997	A new DC drain-current-conductance method (DCCM) for the characterization of effective mobilty (ueff) and series resistances (Rs, Rd) of fresh and hot-carrier stressed graded junction MOSFET's	Lou, C.L.; Chim, W.K. ; Chan, D.S.H. ; Pan, Y.
Oct-1995	A new gate current measurement technique for the characterization of hot-carrier induced degradation in MOSFETs	Leang, S.E.; Chim, W.K. ; Chan, D.S.H.
1995	A novel correction scheme for quantitative voltage contrast measurements using low extraction fields in the scanning electron microscope	Chim, W.K.
Mar-2006	Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurement	Hong, Y.D.; Yeow, Y.T.; Chim, W.K. ; Yan, J.; Wong, K.M.
1-May-2011	Ambiguity in the magnitude and direction of the derived interface dipole in lanthanum aluminate heterostructures: Implications and proposed solution	Liu, Z.Q.; Chim, W.K. ; Chiam, S.Y.; Pan, J.S.; Ng, C.M.
1994	An analytical model for scanning electron microscope Type I magnetic contrast with energy filtering	Chim, W.K.
1-Nov-1997	An analytical model for Type I magnetic contrast enhancement with sample tilting	Chim, W.K.
Jun-1995	An application of spectroscopic emission microscopy and cathodoluminescence to the failure analysis of near-infrared light emitting diodes	Pey, K.L.; Chim, W.K. ; Koh, L.S.; Liu, Y.Y.; Chew, S.Y.C.
Jun-1993	An energy dependent model for type I magnetic contrast in the scanning electron microscope	Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Low, T.S. ; Thirumalai, S.
1999	An improved drain-current-conductance method with substrate back-biasing	Tan, C.B.; Chim, W.K. ; Chan, D.S.H. ; Lou, C.L.
14-Sep-2012	An interface dipole predictive model for high-k dielectric/semiconductor heterostructures using the concept of the dipole neutrality point	Liu, Z.Q.; Chim, W.K. ; Chiam, S.Y.; Pan, J.S.; Ng, C.M.
1997	Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope	Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
May-2001	Analysis of the DCIV peaks in electrically stressed pMOSFETs	Jie, B.B.; Chim, W.K. ; Li, M.-F. ; Lo, K.F.
23-Oct-2000	Anomalous positive charge trapping in thin nitrided oxides under high-field impulse stressing	Lim, P.S.; Chim, W.K.
Sep-1995	Atomic and magnetic force microscopy imaging of thin-film recording heads	Chim, W.K.
2008	Band alignment of yttrium oxide on various relaxed and strained semiconductor substrates	Chiam, S.Y.; Chim, W.K. ; Pi, C.; Huan, A.C.H.; Wang, S.J.; Pan, J.S.; Turner, S.; Zhang, J.
1-May-2013	Band gap, band offsets and dielectric constant improvement by addition of yttrium into lanthanum aluminate	Liu, Z.Q.; Chim, W.K. ; Chiam, S.Y.; Pan, J.S.; Ng, C.M.
Mar-1994	Building-in reliability for silver die attached light emitting diodes	Chim, W.K. ; Chong, K.Y.

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