Browsing by Author CHIM WAI KIN

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Issue DateTitleAuthor(s)
1997New method for the localization of metallization defects using cathodoluminescence imagingLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K. 
1996New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETsLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
1996New purely-experimental technique for extracting the spatial distribution of hot-carrier-induced interface states and trapped charges in MOSFETsLeang, S.E.; Chan, D.S.H. ; Chim, W.K. 
1995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
1995New spectroscopic photon emission microscope system for semiconductor device analysisLiu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. 
1997Numerical prediction of etched profile in pyrolytic laser etchingWee, T.S. ; Lu, Y.F. ; Chim, W.K. 
Aug-1997Numerical prediction of the etched profile in pyrolytic laser etching of silicon and gallium arsenideWee, T.-S.; Lu, Y.-F. ; Chim, W.-K. 
18-Mar-2002Observation of memory effect in germanium nanocrystals embedded in an amorphous silicon oxide matrix of a metal-insulator-semiconductor structureChoi, W.K. ; Chim, W.K. ; Heng, C.L.; Teo, L.W.; Ho, V.; Ng, V. ; Antoniadis, D.A.; Fitzgerald, E.A.
Jul-1994Optoelectronic material analysis and device failure analysis using SEM cathodoluminescencePey, K.L. ; Chim, W.K. ; Phang, J.C.H. ; Chan, D.S.H. 
1-Sep-2005Ordered arrays of highly oriented single-crystal semiconductor nanoparticles on silicon substratesLei, Y. ; Chim, W.K. ; Weissmüller, J.; Wilde, G.; Sun, H.P.; Pan, X.Q.
21-Oct-2003Ordered nanoporous nickel films and their magnetic propertiesLei, Y. ; Chim, W.-K. ; Zhang, Z.; Zhou, T.; Zhang, L.; Meng, G.; Phillipp, F.
15-Mar-2004Origin of charge trapping in germanium nanocrystal embedded SiO 2 system: Role of interfacial traps?Kan, E.W.H.; Choi, W.K. ; Chim, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.
Jul-2004Over-erase phenomenon in SONOS-type flash memory and its minimization using a hafnium oxide charge storage layerTan, Y.-N.; Chim, W.-K. ; Cho, B.J. ; Choi, W.-K. 
2005Physical mechanism of oxide interfacial traps, carrier mobility degradation and series resistance on contrast reversal in scanning-capacitance-microscopy dopant concentration extractionWong, K.M. ; Chim, W.K. ; Yan, J.
1997Post-stress dual-trap interaction in hot-carrier stressed submicrometer n-channel metal-oxide-semiconductor field-effect-transistorsChim, W.K. ; Chua, T.J.
1997Pre-breakdown charge trapping in ESD stressed thin MOS gate oxidesTeh, G.L.; Chim, W.K. 
1997Pre-breakdown charge trapping in ESD stressed thin MOS gate oxidesTeh, G.L.; Chim, W.K. 
2000Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devicesLai, K.-K.; Lim, P.-S.; Chim, W.-K. ; Pan, Y.
2000Process variation during tunnel window formation and its impact on the reliability performance of FLOTOX EEPROM devicesLai, K.-K.; Lim, P.-S.; Chim, W.-K. ; Pan, Y.
21-Jul-1999Properties of 2.7 eV cathodoluminescence from SiO2 film on Si substrateLiu, X.; Phang, J.C.H. ; Chan, D.S.H. ; Chim, W.K.