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CHIM WAI KIN
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Showing results 135 to 154 of 209
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Issue Date
Title
Author(s)
Oct-1998
Low-frequency noise characterizattion of latent damage in thin oxides subjected to high-field impulse stressing
Chim, W.K.
;
Yeo, B.P.
;
Lim, P.S.
;
Chan, D.S.H.
2002
Manipulation of germanium nanocrystals in a tri-layer insulator structure of a metal-insulator-semiconductor memory device
Teo, L.W.
;
Heng, C.L.
;
Ho, V.
;
Tay, M.
;
Choi, W.K.
;
Chim, W.K.
;
Antoniadis, D.A.
;
Fitzgerald, E.A.
2000
Mechanism of laser-induced nanomodification on hydrogen-passivated Si(100) surfaces underneath the tip of a scanning tunneling microscope
Mai, Z.H.
;
Lu, Y.F.
;
Huang, S.M.
;
Chim, W.K.
;
Pan, J.S.
23-Jan-1996
Method and apparatus for measuring quantitative voltage contrast
CHIM, WAI K.
;
PHANG, JACOB C. H.
;
CHAN, DANIEL S. H.
1-Jan-2002
Microstructural characterization of rf sputtered polycrystalline silicon germanium films
Choi, W.K.
;
Teh, L.K.
;
Bera, L.K.
;
Chim, W.K.
;
Wee, A.T.S.
;
Jie, Y.X.
31-May-2004
Minimization of germanium penetration, nanocrystal formation, charge storage, and retention in a trilayer memory structure with silicon nitride/hafnium dioxide stack as the tunnel dielectric
Ng, T.H.
;
Chim, W.K.
;
Choi, W.K.
;
Ho, V.
;
Teo, L.W.
;
Du, A.Y.
;
Tung, C.H.
15-Oct-2003
Modeling of charge quantization and wave function penetration effects in a metal-oxide-semiconductor system with ultrathin gate oxide
Chim, W.K.
;
Zheng, J.X.
;
Koh, B.H.
1-Dec-2002
Modeling the trap generation and relaxation effects in thin oxides under unipolar and bipolar high-field impulse stressing using stress-induced leakage current
Chim, W.K.
;
Tan, Y.N.
Dec-1992
Modelling techniques for the quantification of some electron beam induced phenomena
Chim, W.K.
;
Chan, D.S.H.
;
Low, T.S.
;
Phang, J.C.H.
;
Sim, K.S.
;
Pey, K.L.
;
Dinnis, A.R.
;
Holt, D.B.
;
Nakamae, K.
;
Schottler, M.
Dec-1992
Modelling techniques for the quantification of some electron beam induced phenomena
Chim, W.K.
;
Chan, D.S.H.
;
Low, T.S.
;
Phang, J.C.H.
;
Sim, K.S.
;
Pey, K.L.
;
Dinnis, A.R.
;
Holt, D.B.
;
Nakamae, K.
;
Schottler, M.
May-1998
Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing
Qin, W.H.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lou, C.L.
May-1998
Modelling the degradation in the subthreshold characteristics of submicrometre LDD PMOSFETs under hot-carrier stressing
Qin, W.H.
;
Chim, W.K.
;
Chan, D.S.H.
;
Lou, C.L.
1997
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
Lou, C.L.
;
Qin, W.H.
;
Chim, W.K.
;
Chan, D.S.H.
1997
Modelling the hot-carrier induced degradation in the subthreshold characteristics of submicrometer LDD PMOSFETs
Lou, C.L.
;
Qin, W.H.
;
Chim, W.K.
;
Chan, D.S.H.
Oct-2003
Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy Measurements
Chim, W.K.
;
Wong, K.M.
;
Yeow, Y.T.
;
Hong, Y.D.
;
Lei, Y.
;
Teo, L.W.
;
Choi, W.K.
1999
Nanolithography by tip-enhanced laser irradiation
Mai, Z.H.
;
Lu, Y.F.
;
Song, W.D.
;
Chim, W.K.
1999
Nanolithography by tip-enhanced laser irradiation
Mai, Z.H.
;
Lu, Y.F.
;
Song, W.D.
;
Chim, W.K.
2006
Native point defects in yttria and relevance to its use as a high-dielectric-constant gate oxide material: First-principles study
Zheng, J.X.
;
Ceder, G.
;
Maxisch, T.
;
Chim, W.K.
;
Choi, W.K.
Apr-1998
Neutral electron trap generation and hole trapping in thin oxides under electrostatic discharge stress
Chim, W.K.
;
Teh, G.L.
Apr-1998
Neutral electron trap generation and hole trapping in thin oxides under electrostatic discharge stress
Chim, W.K.
;
Teh, G.L.