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Issue Date	Title	Author(s)
Mar-2004	Fermi-Level Pinning Induced Thermal Instability in the Effective Work Function of TaN in TaN/SiO 2 Gate Stack	Ren, C.; Yu, H.Y. ; Kang, J.F. ; Hou, Y.T. ; Li, M.-F. ; Wang, W.D.; Chan, D.S.H. ; Kwong, D.-L.
2003	Germanium MOS: An Evaluation from Carrier Quantization and Tunneling Current	Low, T.; Hou, Y.T. ; Li, M.F. ; Zhu, C. ; Kwong, D.-L.; Chin, A.
Jun-2001	Hole quantization effects and threshold voltage shift in pMOSFET - Assessed by improved one-band effective mass approximation	Hou, Y.T. ; Li, M.-F.
May-2002	Hole tunneling current through oxynitride/oxide stack and the stack optimization for p-MOSFETs	Yu, H.Y. ; Hou, Y.T. ; Li, M.F. ; Kwong, D.-L.
May-2002	Hole tunneling current through oxynitride/oxide stack and the stack optimization for p-MOSFETs	Yu, H.Y. ; Hou, Y.T. ; Li, M.F. ; Kwong, D.-L.
2004	Impact of metal gate work function on nano CMOS device performance	Hou, Y.T. ; Low, T.; Xu, B.; Li, M.-F. ; Samudra, G. ; Kwong, D.L.
May-2003	Improved one-band self-consistent effective mass methods for hole quantization in p-MOSFET	Low, T.; Hou, Y.-T. ; Li, M.-F.
May-2003	Improved one-band self-consistent effective mass methods for hole quantization in p-MOSFET	Low, T.; Hou, Y.-T. ; Li, M.-F.
15-Nov-1999	Influence of Si doping on the infrared reflectance characteristics of GaN grown on sapphire	Hou, Y.T. ; Feng, Z.C.; Chua, S.J. ; Li, M.F. ; Akutsu, N.; Matsumoto, K.
15-Nov-1999	Influence of Si doping on the infrared reflectance characteristics of GaN grown on sapphire	Hou, Y.T. ; Feng, Z.C.; Chua, S.J. ; Li, M.F. ; Akutsu, N.; Matsumoto, K.
Dec-2001	Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates	Feng, Z.C.; Yang, T.R.; Hou, Y.T.
Dec-2001	Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substrates	Feng, Z.C.; Yang, T.R.; Hou, Y.T.
Nov-1999	Infrared reflectance investigation of undoped and Si-doped GaN films on sapphire	Feng, Z.C.; Hou, Y.T. ; Li, M.F. ; Chua, S.J. ; Wang, W.; Zhu, L.
Nov-1999	Infrared reflectance investigation of undoped and Si-doped GaN films on sapphire	Feng, Z.C.; Hou, Y.T. ; Li, M.F. ; Chua, S.J. ; Wang, W.; Zhu, L.
Jun-2001	Infrared reflectance of GaN films grown on Si(001) substrates	Zhang, X. ; Hou, Y.-T. ; Feng, Z.-C.; Chen, J.-L.
Jun-2001	Infrared reflectance of GaN films grown on Si(001) substrates	Zhang, X. ; Hou, Y.-T. ; Feng, Z.-C.; Chen, J.-L.
1999	Infrared reflectance studies of GaN epitaxial films on sapphire substrate	Feng, Z.C.; Hou, Y.T. ; Chua, S.J. ; Li, M.F.
1999	Infrared reflectance studies of GaN epitaxial films on sapphire substrate	Feng, Z.C.; Hou, Y.T. ; Chua, S.J. ; Li, M.F.
Jul-2002	Investigation of hole-tunneling current through ultrathin oxynitride/oxide stack gate dielectrics in p-MOSFETs	Yu, H. ; Hou, Y.-T. ; Li, M.-F. ; Kwong, D.-L.
2003	Investigation of Performance Limits of Germanium Double-Gated MOSFETs	Low, T.; Hou, Y.T. ; Li, M.F. ; Zhu, C. ; Chin, A.; Samudra, G. ; Chan, L.; Kwong, D.-L.

Showing results 8 to 27 of 39 < previous next >