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HOU YONG TIAN
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Showing results 21 to 39 of 39
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Issue Date
Title
Author(s)
Nov-1999
Infrared reflectance investigation of undoped and Si-doped GaN films on sapphire
Feng, Z.C.
;
Hou, Y.T.
;
Li, M.F.
;
Chua, S.J.
;
Wang, W.
;
Zhu, L.
Jun-2001
Infrared reflectance of GaN films grown on Si(001) substrates
Zhang, X.
;
Hou, Y.-T.
;
Feng, Z.-C.
;
Chen, J.-L.
Jun-2001
Infrared reflectance of GaN films grown on Si(001) substrates
Zhang, X.
;
Hou, Y.-T.
;
Feng, Z.-C.
;
Chen, J.-L.
1999
Infrared reflectance studies of GaN epitaxial films on sapphire substrate
Feng, Z.C.
;
Hou, Y.T.
;
Chua, S.J.
;
Li, M.F.
1999
Infrared reflectance studies of GaN epitaxial films on sapphire substrate
Feng, Z.C.
;
Hou, Y.T.
;
Chua, S.J.
;
Li, M.F.
Jul-2002
Investigation of hole-tunneling current through ultrathin oxynitride/oxide stack gate dielectrics in p-MOSFETs
Yu, H.
;
Hou, Y.-T.
;
Li, M.-F.
;
Kwong, D.-L.
2003
Investigation of Performance Limits of Germanium Double-Gated MOSFETs
Low, T.
;
Hou, Y.T.
;
Li, M.F.
;
Zhu, C.
;
Chin, A.
;
Samudra, G.
;
Chan, L.
;
Kwong, D.-L.
Jan-2004
Light Emission Near 1.3 μm Using ITO-Al 2O 3-Si 0.3Ge 0.7-Si Tunnel Diodes
Lin, C.Y.
;
Chin, A.
;
Hou, Y.T.
;
Li, M.F.
;
McAlister, S.P.
;
Kwong, D.L.
Nov-2004
Metal gate work function engineering on gate leakage of MOSFETs
Hou, Y.-T.
;
Li, M.-F.
;
Low, T.
;
Kwong, D.-L.
18-Jun-2001
Modeling and characterization of direct tunneling hole current through ultrathin gate oxide in p-metal-oxide-semiconductor field-effect transistors
Hou, Y.T.
;
Li, M.F.
;
Lai, W.H.
;
Jin, Y.
18-Jun-2001
Modeling and characterization of direct tunneling hole current through ultrathin gate oxide in p-metal-oxide-semiconductor field-effect transistors
Hou, Y.T.
;
Li, M.F.
;
Lai, W.H.
;
Jin, Y.
Feb-2003
Modeling of tunneling currents through HfO2 and (HfO2)x(Al2O3)1-x gate stacks
Hou, Y.T.
;
Li, M.F.
;
Yu, H.Y.
;
Kwong, D.-L.
1999
Piezoelectric Franz-Keldysh effect in a GaN/InGaN/AlGaN multilayer structure
Hou, Yong Tian
;
Teo, Kie Leong
;
Li, Ming Fu
;
Uchida, Kazuo
;
Tokunaga, Hiroki
;
Akutsu, Nakao
;
Matsumoto, Koh
1999
Piezoelectric Franz-Keldysh effect in a GaN/InGaN/AlGaN multilayer structure
Hou, Yong Tian
;
Teo, Kie Leong
;
Li, Ming Fu
;
Uchida, Kazuo
;
Tokunaga, Hiroki
;
Akutsu, Nakao
;
Matsumoto, Koh
2002
Quantum tunneling and scalability of HfO2 and HfAlO gate stacks
Hou, Y.T.
;
Li, M.F.
;
Yu, H.Y.
;
Jin, Y.
;
Kwong, D.-L.
Feb-2004
Robust High-Quality HfN-HfO 2 Gate Stack for Advanced MOS Device Applications
Yu, H.Y.
;
Kang, J.F.
;
Ren, C.
;
Chen, J.D.
;
Hou, Y.T.
;
Shen, C.
;
Li, M.F.
;
Chan, D.S.H.
;
Bera, K.L.
;
Tung, C.H.
;
Kwong, D.-L.
2004
Selected topics on HfO 2 gate dielectrics for future ULSI CMOS devices
Li, M.F.
;
Yu, H.Y.
;
Hou, Y.T.
;
Kang, J.F.
;
Wang, X.P.
;
Shen, C.
;
Ren, C.
;
Yeo, Y.C.
;
Zhu, C.X.
;
Chan, D.S.H.
;
Chin, A.
;
Kwong, D.L.
1999
Structural and optical properties of GaN materials grown on Si by metalorganic chemical vapor deposition
Chen, J.L.
;
Feng, Z.C.
;
Zhang, X.
;
Chua, S.J.
;
Hou, Y.T.
;
Lin, J.
2003
Thermally Robust High Quality HfN/HfO 2 Gate Stack for Advanced CMOS Devices
Yu, H.Y.
;
Kang, J.F.
;
Chen, J.D.
;
Ren, C.
;
Hou, Y.T.
;
Whang, S.J.
;
Li, M.-F.
;
Chan, D.S.H.
;
Bera, K.L.
;
Tung, C.H.
;
Du, A.
;
Kwong, D.-L.