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Issue Date	Title	Author(s)
Feb-2010	Bridging physics to electronics - An outreach effort	Tan, K.-K. ; Tang, K.-Z. ; Ng, V. ; Tay, A. ; Yen, S.-C. ; Lee, T.-H.
2008	CD uniformity control via real-time control of photoresist properties	Chen, M.; Fu, J. ; Ho, W.K. ; Tay, A.
Feb-2005	Characterizing photolithographic linewidth sensitivity to process temperature variations for advanced resists using a thermal array	Schaper, C.D.; El-Awady, K.; Kailath, T.; Tay, A. ; Lee, L.L.; Ho, W.K. ; Fuller, S.E.
2005	Combined data reconciliation and parameter estimation	Thian, B.S.; Joe, Y.Y.; Tay, A. ; Doan, X.-T.
Jul-2010	Computationally efficient behaviour based controller for real time car racing simulation	Tan, C.H.; Tan, K.C. ; Tay, A.
Feb-2004	Constraint feedforward control for thermal processing of quartz photomasks in microelectronics manufacturing	Tay, A. ; Ho, W.K. ; Schaper, C.D.; Lee, L.L.
2002	Control and signal processing for photoresist processing in microlithography	Tay, A. ; Ho, W.K. ; Lim, K.W. ; Loh, A.P. ; Tan, W.W.
15-Jan-2006	Control of photoresist film thickness: Iterative feedback tuning approach	Tay, A. ; Khuen Ho, W. ; Deng, J.; Keng Lok, B.
2003	Control of Photoresist Thickness Uniformity in the Microlithography Process	Tay, A.
2009	Control of semiconductor substrate temperature uniformity during photoresist processing in lithography	Tay, A. ; Chua, H.-T.; Wang, Y.; Yang, G.
Dec-2008	Critical dimension and real-time temperature control for warped wafers	Ho, W.K. ; Tay, A. ; Fu, J. ; Chen, M.; Feng, Y.
Nov-2007	Critical dimension uniformity via real-time photoresist thickness control	Ho, W.K. ; Tay, A. ; Chen, M.; Fu, J. ; Lu, H.; Shan, X.
Aug-2003	Design and implementation of a distributed evolutionary computing software	Tan, K.C. ; Tay, A. ; Cai, J.
2008	Design-process integration for performance-based OPC framework	Teh, S.-H.; Heng, C.-H. ; Tay, A.
2004	Detection of Wafer warpages during thermal processing in microlithography	Ho, W.K. ; Tay, A. ; Zhou, Y.; Yang, K.; Hu, N.
2009	Development of a framework and system for remote electronics experiments	Tang, K.Z. ; Tan, K.K. ; Goh, Y.H.; Tay, A. ; Huang, S.N. ; Lee, T.H.
2012	Development of in-situ real-time CD monitoring and control system through PEB process	Yang, G.; Tay, A. ; Ho, W.K.
2008	Device performance-based OPC for optimal circuit performance and mask cost reduction	Teh, S.-H.; Heng, C.-H. ; Tay, A.
2008	Direct measurement of beam size in a spectroscopic ellipsometry setup	Tay, A. ; Ng, T.W.; Wang, Y.; Zhao, S.
2007	Discovering Chinese chess strategies through coevolutionary approaches	Ong, C.S.; Quek, H.Y.; Tan, K.C. ; Tay, A.

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