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Issue Date	Title	Author(s)
1996	Performance and gain and phase margins of well-known PID tuning formulas	Ho, W.K. ; Gan, O.P.; Tay, E.B. ; Ang, E.L.
1996	Performance and gain and phase margins of well-known PID tuning formulas	Ho, W.K. ; Gan, O.P.; Tay, E.B. ; Ang, E.L.
Jan-2010	Performance-based optical proximity correction methodology	Teh, S.-H.; Heng, C.-H. ; Tay, A.
2007	Piezo-assisted intra-cytoplasmic sperm injection: A comparative study of two penetration techniques	Putra, A.S. ; Huang, S. ; Tan, K.K. ; Panda, S.K. ; Lee, T.H. ; Tay, A. ; Ng, S.C.
2009	Predictive ratio control for interacting processes	Tan, K.K. ; Tay, A. ; Shao, Z. ; Huang, S. ; Lee, T.H.
Jan-2004	Processing chemically amplified resists on advanced photomasks using a thermal array	Schaper, C.D.; El-Awady, K.; Kailath, T.; Tay, A. ; Lee, L.L.; Ho, W.-K. ; Fuller, S.E.
Jun-2009	Public goods provision: An evolutionary game theoretic study under asymmetric information	Quek, H.-Y.; Tan, K.C. ; Tay, A.
2013	RBF-based compensation method on displacement and thermal error	Tan, K.K. ; Yang, R. ; Er, P.V.; Tay, A. ; Teo, C.S.
2005	Real-time control of photoresist absorption coefficient uniformity	Tay, A. ; Ho, W.-K. ; Wu, X.; Tsai, K.-Y.
2005	Real-time control of photoresist development process	Tay, A. ; Ho, W.-K. ; Kiew, C.-M.; Zhou, Y.; Lee, J.H.
Jan-2007	Real-time control of photoresist extinction coefficient uniformity in the microlithography process	Tay, A. ; Ho, W.K. ; Wu, X.
2008	Real-time estimation and control of CD uniformity in lithography	Tay, A.
2007	Real-time estimation and control of photoresist properties in microlithography	Wu, X.; Tay, A. ; Ho, W.K. ; Tan, K.K.
2006	Real-time monitoring of photoresist thickness contour in microlithography	Ho, W.K. ; Chen, X.; Wu, X.; Tay, A.
2007	Real-time spatial control of photoresist development rate	Tay, A. ; Ho, W.-K. ; Hu, N.; Kiew, C.-M.; Tsai, K.-Y.
2006	Real-time spatial control of steady-state wafer temperature during thermal processing in microlithography	Tay, A. ; Ho, W.-K. ; Hu, N.; Tsai, K.-Y.; Zhou, Y.
2018	Regression analysis of gait parameters and mobility measures in a healthy cohort for subject-specific normative values	Mikos V. ; Yen S.-C. ; Tay A. ; Heng C.-H. ; Chung C.L.H.; Liew S.H.X.; Tan D.M.L. ; Au W.L.
Aug-2002	Resist film uniformity in the microlithography process	Ho, W.K. ; Lee, L.L.; Tay, A. ; Schaper, C.
2006	Robust real-time thin film thickness estimation	Kiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Lee, J.H.
2002	Run-to-run process control for chemical mechanical polishing in semiconductor manufacturing	Da, L.; Kumar, V.G.; Tay, A. ; Al Mamun, A. ; Ho, W.K. ; See, A.; Chan, L.

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