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Browsing by Author MA FAJUN

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Showing results 4 to 17 of 17 < previous 
Issue DateTitleAuthor(s)
2009Characterization and modeling of subfemtofarad nanowire capacitance using the CBCM techniqueZhao, H.; Kim, R.; Paul, A.; Luisier, M.; Klimeck, G.; Ma, F.-J. ; Rustagi, S.C.; Samudra, G.S. ; Singh, N.; Lo, G.-Q.; Kwong, D.-L.
2009Charge-based capacitance measurement technique for nanoscale devices: Accuracy assessment based on TCAD simulationsZhao, H.; Rustagi, S.C.; Ma, F.-J. ; Samudra, G.S. ; Singh, N.; Lo, G.Q.; Kwong, D.-L.
7-Sep-2013Deposition temperature independent excellent passivation of highly boron doped silicon emitters by thermal atomic layer deposited Al2O 3Liao, B.; Stangl, R.; Ma, F. ; Hameiri, Z.; Mueller, T.; Chi, D.; Aberle, A.G. ; Bhatia, C.S. ; Hoex, B. 
25-Sep-2013Excellent c-Si surface passivation by thermal atomic layer deposited aluminum oxide after industrial firing activationLiao, B.; Stangl, R.; Ma, F. ; Mueller, T.; Lin, F. ; Aberle, A.G. ; Bhatia, C.S. ; Hoex, B. 
2014Excellent surface passivation of heavily doped p+ silicon by low-temperature plasma-deposited SiOx/SiNy dielectric stacks with optimised antireflective performance for solar cell applicationDuttagupta, S.; Ma, F.-J. ; Hoex, B. ; Aberle, A.G. 
2009Modeling of stress-retarded orientation-dependent oxidation: Shape engineering of silicon nanowire channelsMa, F.-J. ; Rustagi, S.C.; Zhao, H.; Samudra, G.S. ; Singh, N.; Budhaaraju, K.D.; Lo, G.Q.; Kwong, D.L.
Jul-2010Modeling of stress-retarded thermal oxidation of nonplanar silicon structures for realization of nanoscale devicesMa, F.-J. ; Rustagi, S.C.; Samudra, G.S. ; Zhao, H.; Singh, N.; Lo, G.-Q.; Kwong, D.-L.
2012Modelling and simulation of field-effect surface passivation of crystalline silicon-based solar cellsMa, F.-J. ; Hoex, B. ; Samudra, G.S. ; Aberle, A.G. 
2013Numerical analysis of p+ emitters passivated by a PECVD AlO x/SiNx stackMa, F.-J. ; Duttagupta, S.; Peters, M.; Samudra, G.S. ; Aberle, A.G. ; Hoex, B.
2012Optimised antireflection coatings using silicon nitride on textured silicon surfaces based on measurements and multidimensional modellingDuttagupta, S.; Ma, F. ; Hoex, B. ; Mueller, T.; Aberle, A.G. 
2013Progress in surface passivation of heavily doped n-type and p-type silicon by plasma-deposited AlO x/SiNx dielectric stacksDuttagupta, S.; Ma, F.-J. ; Lin, S.F.; Mueller, T.; Aberle, A.G. ; Hoex, B. 
2012State-of-the-art surface passivation of boron emitters using inline PECVD AlOx/SiNx stacks for industrial high-efficiency silicon wafer solar cellsDuttagupta, S.; Lin, F. ; Shetty, K.D.; Wilson, M.; Ma, F.-J. ; Lin, J. ; Aberle, A.G. ; Hoex, B. 
2010Study on SiGe nanowire shape engineering and Ge condensationMa, F.-J. ; Chia, B.S.; Rustagi, S.C.; Samudr, G.C.
2008Sub-femto-farad capacitance-voltage characteristics of single channel gate-all-around nano wire transistors for electrical characterization of carrier transportZhao, H.; Rustagi, S.C.; Singh, N.; Ma, F.-J. ; Samudra, G.S. ; Budhaaraju, K.D.; Manhas, S.K.; Tung, C.H.; Lo, G.Q.; Baccarani, G.; Kwong, D.L.
Showing results 4 to 17 of 17 < previous