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KIM SUN-JUNG
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Showing results 21 to 26 of 26
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Issue Date
Title
Author(s)
1999
Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions
Cho, Byung Jin
;
Kim, Sun Jung
;
Ling, C.H.
;
Joo, Moon Sig
;
Yeo, In Seok
1999
Radiation-induced leakage current of ultra-thin gate oxide under X-ray lithography conditions
Cho, Byung Jin
;
Kim, Sun Jung
;
Ling, C.H.
;
Joo, Moon Sig
;
Yeo, In Seok
2000
Reduction of radiation-induced leakage currents in thin oxides by application of a low post-irradiation gate bias
Ang, Chew-Hoe
;
Ling, Chung-Ho
;
Cheng, Zhi-Yuan
;
Kim, Sun-Jung
;
Cho, Byung-Jin
Apr-2001
Reliability of thin gate oxides irradiated under X-ray lithography conditions
Cho, B.J.
;
Kim, S.J.
;
Ang, C.H.
;
Ling, C.H.
;
Joo, M.S.
;
Yeo, I.S.
Jun-2004
RF, DC, and reliability characteristics of ALD HfO2-Al2O3 laminate MIM capacitors for Si RF IC applications
Ding, S.-J.
;
Hu, H.
;
Zhu, C.
;
Kim, S.J.
;
Yu, X.
;
Li, M.-F.
;
Cho, B.J.
;
Chan, D.S.H.
;
Yu, M.B.
;
Rustagi, S.C.
;
Chin, A.
;
Kwong, D.-L.
2003
Voltage and Temperature Dependence of Capacitance of High-K HfO 2 MIM Capacitors: A Unified Understanding and Prediction
Zhu, C.
;
Hu, H.
;
Yu, X.
;
Kim, S.J.
;
Chin, A.
;
Li, M.F.
;
Cho, B.J.
;
Kwong, D.L.