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Showing results 8 to 27 of 76 < previous   next >
Issue DateTitleAuthor(s)
Jul-2001Channeling contrast microscopy on lateral epitaxial overgrown GaNTeo, E.J. ; Osipowicz, T. ; Bettiol, A.A. ; Watt, F. ; Hao, M.S.; Chua, S.J.
Apr-2005Characterisation of 60° misfit dislocations in SiGe alloy using nuclear microscopyHuang, L.; Breese, M.B.H. ; Teo, E.J. 
Mar-2002Characteristics of nickel-containing carbon films deposited using electron cyclotron resonance CVDHuang, Q.F.; Yoon, S.F.; Rusli; Zhang, Q.; Ahn, J.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
8-Nov-2004Controlled intensity emission from patterned porous silicon using focused proton beam irradiationTeo, E.J. ; Mangaiyarkarasi, D. ; Breese, M.B.H. ; Bettiol, A.A. ; Blackwood, D.J. 
2005Controlled shift in emission wavelength from patterned porous silicon using focused ion beam irradiationMangaiyarkarasi, D. ; Teo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Blackwood, D.J. 
1-Aug-2004Depth-resolved luminescence imaging of epitaxial lateral overgrown GaN using ionoluminescenceTeo, E.J. ; Bettiol, A.A. ; Osipowicz, T. ; Hao, M.; Chua, S.J. ; Liu, Y.Y. 
Jul-2002Deuterium-oxygen exchange on diamond (100)-A study by ERDA, RBS and TOF-SIMSLoh, K.P. ; Xie, X.N. ; Zhang, X. ; Teo, E.J. ; Osipowicz, T. ; Lai, M.Y.; Yakovlev, N.
Jun-2001Effect of radio-frequency bias voltage on the optical and structural properties of hydrogenated amorphous silicon carbideCui, J.; Rusli; Yoon, S.F.; Teo, E.J. ; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Osipowicz, T. ; Watt, F. 
May-2010Effects of focused MeV ion beam irradiation on the roughness of electrochemically micromachined silicon surfacesOw, Y.S. ; Azimi, S.; Breese, M.B.H. ; Teo, E.J. ; Mangaiyarkarasi, D. 
Aug-1999Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbonZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Yang, H.; Yang, C. ; Watt, F. ; Teo, E.J. ; Osipowice, T. 
1-Mar-2001Effects of microwave power on the structural and emission properties of hydrogenated amorphous silicon carbide deposited by electron cyclotron resonance chemical vapor depositionCui, J.; Rusli, R.; Yoon, S.F.; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
15-Oct-2009Effects of oxide formation around core circumference of silicon-on-oxidized-porous-silicon strip waveguidesTeo, E.J. ; Xiong, B.Q.; Ow, Y.S. ; Breese, M.B.H. ; Bettiol, A.A. 
Jul-2007Embedded photonic structures fabricated in photosensitive glass using proton beam writingBettiol, A.A. ; Udalagama, C.N.B. ; Teo, E.J. ; van Kan, J.A. ; Watt, F. 
3-Sep-2004Enhanced planar channeling of MeV protons through thin crystalsBreese, M.B.H. ; Rana, M.A.; Osipowicz, T. ; Teo, E.J. 
2006Fabrication of buried channel waveguides in photosensitive glass using proton beam writingBettiol, A.A. ; Venugopal Rao, S.; Teo, E.J. ; Van Kan, J.A. ; Watt, F. 
1-Mar-2009Fabrication of low-loss silicon-on-oxidized-porous-silicon strip waveguide using focused proton-beam irradiationTeo, E.J. ; Bettiol, A.A. ; Yang, P.; Breese, M.B.H. ; Xiong, B.Q.; Mashanovich, G.Z.; Headley, W.R.; Reed, G.T.
Aug-2006Fabrication of patterned porous silicon using high-energy ion irradiationTeo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Champeaux, F.J.T.; Watt, F. ; Blackwood, D.J. 
2010Fabrication of porous silicon channel waveguides with multilayer Bragg claddingBettiol, A.A. ; Teo, E.J. ; Prashant, S.; Boqian, X.; Breese, M.B.H. 
2004Fabrication of silicon microstructures using a high energy ion beamTeo, E.J. ; Liu, M.H. ; Breese, M.B.H. ; Tavernier, E.P.; Bettiol, A.A. ; Blackwood, D.J. ; Watt, F. 
15-Oct-2011Fabrication of smooth silicon optical devices using proton beam writingTeo, E.J. ; Bettiol, A.A. ; Xiong, B.Q.