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Showing results 16 to 35 of 76 < previous   next >
Issue DateTitleAuthor(s)
May-2010Effects of focused MeV ion beam irradiation on the roughness of electrochemically micromachined silicon surfacesOw, Y.S. ; Azimi, S.; Breese, M.B.H. ; Teo, E.J. ; Mangaiyarkarasi, D. 
Aug-1999Effects of high energetic He+ ion irradiation on the structure of polymeric hydrogenated amorphous carbonZhang, Q.; Yoon, S.F.; Ahn, J.; Rusli; Yang, H.; Yang, C. ; Watt, F. ; Teo, E.J. ; Osipowice, T. 
1-Mar-2001Effects of microwave power on the structural and emission properties of hydrogenated amorphous silicon carbide deposited by electron cyclotron resonance chemical vapor depositionCui, J.; Rusli, R.; Yoon, S.F.; Yu, M.B.; Chew, K.; Ahn, J.; Zhang, Q.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
15-Oct-2009Effects of oxide formation around core circumference of silicon-on-oxidized-porous-silicon strip waveguidesTeo, E.J. ; Xiong, B.Q.; Ow, Y.S. ; Breese, M.B.H. ; Bettiol, A.A. 
Jul-2007Embedded photonic structures fabricated in photosensitive glass using proton beam writingBettiol, A.A. ; Udalagama, C.N.B. ; Teo, E.J. ; van Kan, J.A. ; Watt, F. 
3-Sep-2004Enhanced planar channeling of MeV protons through thin crystalsBreese, M.B.H. ; Rana, M.A.; Osipowicz, T. ; Teo, E.J. 
2006Fabrication of buried channel waveguides in photosensitive glass using proton beam writingBettiol, A.A. ; Venugopal Rao, S.; Teo, E.J. ; Van Kan, J.A. ; Watt, F. 
1-Mar-2009Fabrication of low-loss silicon-on-oxidized-porous-silicon strip waveguide using focused proton-beam irradiationTeo, E.J. ; Bettiol, A.A. ; Yang, P.; Breese, M.B.H. ; Xiong, B.Q.; Mashanovich, G.Z.; Headley, W.R.; Reed, G.T.
Aug-2006Fabrication of patterned porous silicon using high-energy ion irradiationTeo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Champeaux, F.J.T.; Watt, F. ; Blackwood, D.J. 
2010Fabrication of porous silicon channel waveguides with multilayer Bragg claddingBettiol, A.A. ; Teo, E.J. ; Prashant, S.; Boqian, X.; Breese, M.B.H. 
2004Fabrication of silicon microstructures using a high energy ion beamTeo, E.J. ; Liu, M.H. ; Breese, M.B.H. ; Tavernier, E.P.; Bettiol, A.A. ; Blackwood, D.J. ; Watt, F. 
15-Oct-2011Fabrication of smooth silicon optical devices using proton beam writingTeo, E.J. ; Bettiol, A.A. ; Xiong, B.Q.
Sep-2003Focusing of MeV ion beams by means of tapered glass capillary opticsNebiki, T.; Yamamoto, T.; Narusawa, T.; Breese, M.B.H. ; Teo, E.J. ; Watt, F. 
2007Freestanding waveguides in siliconYang, P.Y.; Mashanovich, G.Z.; Gomez-Morilla, I.; Headley, W.R.; Reed, G.T.; Teo, E.J. ; Blackwood, D.J. ; Breese, M.B.H. ; Bettiol, A.A. 
2007Future prospects for silicon photonicsHeadley, W.R.; Reed, G.T.; Mashanovich, G.Z.; Timotijevic, B.; Gardes, F.Y.; Thomson, D.; Yang, P.; Teo, E.-J. ; Blackwood, D.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Waugh, P.
1-Apr-2002Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopyChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Zhang, Q.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
Mar-2004High quality ion-induced secondary electron imaging for MeV nuclear microprobe applicationsTeo, E.J. ; Breese, M.B.H. ; Bettiol, A.A. ; Watt, F. ; Alves, L.C.
2006Hole transport through proton-irradiated p -type silicon wafers during electrochemical anodizationBreese, M.B.H. ; Champeaux, F.J.T.; Teo, E.J. ; Bettiol, A.A. ; Blackwood, D.J. 
2-Sep-1999Hydrogen 3D distribution in solids by ERDA imagingYang, C. ; Teo, E.J. ; Osipowicz, T. ; Watt, F. ; Jamieson, D.; Lee, K.K.; Tomcik, B. 
1-Sep-2002Hydrogenated amorphous silicon carbide deposition using electron cyclotron resonance chemical vapor deposition under high microwave power and strong hydrogen dilutionChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F.