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Issue DateTitleAuthor(s)
Feb-2002Phase separation in Zn-doped InGaN grown by metalorganic chemical vapor depositionFeng, Z.C.; Yang, T.R.; Liu, R. ; Wee, T.S.A. 
Aug-2006Probing Co/Si interface behaviour by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM)PAN, J.S.P; LIU, R.S.L ; TOK, E.S.T 
10-Jun-2003Probing the behaviour of ultra thin Co layers on clean and hydrogen terminated Si(0 0 1) and Si(1 1 1) surfacesPan, J.S.; Tok, E.S. ; Huan, C.H.A. ; Liu, R.S. ; Chai, J.W.; Ong, W.J.; Toh, K.C.
9-May-2011Room temperature ferromagnetism in partially hydrogenated epitaxial grapheneXie, L.; Wang, X.; Lu, J.; Ni, Z.; Luo, Z.; Mao, H. ; Wang, R.; Wang, Y.; Huang, H. ; Qi, D. ; Liu, R. ; Yu, T.; Shen, Z.; Wu, T.; Peng, H.; Özyilmaz, B. ; Loh, K. ; Wee, A.T.S. ; Ariando ; Chen, W. 
Jan-2004Roughening behavior in Si/SiGe heterostructures under O2 + bombardmentLau, G.S.; Tok, E.S. ; Liu, R. ; Wee, A.T.S. ; Zhang, J.
28-Mar-2003Selective area growth of aligned carbon nanotubes by ion beam surface modificationGohel, A.; Chin, K.C. ; Lim, K.Y.; Tay, S.T.; Liu, R. ; Chen, G.S.; Wee, A.T.S. 
Jul-2006Self-organized nanodot formation on InP(1 0 0) by oxygen ion sputteringTan, S.K.; Liu, R. ; Sow, C.H. ; Wee, A.T.S. 
1-Jun-2006Sharp n-type doping profiles in Si/SiGe heterostructures produced by atomic hydrogen etchingZhang, J.; Turner, S.G.; Chiam, S.Y.; Liu, R. ; Tok, E.S. ; Wee, A.T.S. ; Huan, A.C.H.; Kelly, I.; Mulcahy, C.P.A.
15-Jan-2003SIMS backside depth profiling of ultra shallow implantsYeo, K.L.; Wee, A.T.S. ; See, A.; Liu, R. ; Ng, C.M.
May-2002SIMS backside depth profiling of ultrashallow implants using silicon-on-insulator substratesYeo, K.L.; Wee, A.T.S. ; Liu, R. ; Ng, C.M.; See, A.
20-Jan-2002Sims depth profiling analysis of Cu/Ta/SiO2 interfacial diffusion at different annealing temperatureLiu, L. ; Gong, H. ; Wang, Y. ; Wee, A.T.S. ; Liu, R. 
2001SIMS study of silicon oxynitride rapid thermally grown in nitric oxideLiu, R. ; Koa, K.H.; Wee, A.T.S. ; Lai, W.H.; Li, M.F. ; See, A.; Chan, L.
1-Jan-2000Structural characterization of rapid thermal oxidized Si1-x-yGexCy alloy films grown by rapid thermal chemical vapor depositionChoi, W.K. ; Chen, J.H. ; Bera, L.K. ; Feng, W.; Pey, K.L. ; Mi, J.; Yang, C.Y.; Ramam, A. ; Chua, S.J. ; Pan, J.S. ; Wee, A.T.S. ; Liu, R. 
Sep-2004Study of copper diffusion into Ta and TaN barrier materials for MOS devicesLoh, S.W.; Zhang, D.H.; Li, C.Y.; Liu, R. ; Wee, A.T.S. 
20-Jan-2002Study of copper diffusion into tantalum and tantalum diffusion into copperLoh, S.W.; Zhang, D.H.; Li, C.Y.; Liu, R. ; Wee, A.T.S. 
2002Study of copper diffusion into tantalum nitride (Ta2N) by rapid thermal annealing (RTA)Loh, S.W.; Zhang, D.H.; Liu, R. ; Li, C.Y.; Wee, A.T.S. 
Oct-2001Study of copper suicide retardation effects on copper diffusion in siliconLee, C.S.; Gong, H. ; Liu, R. ; Wee, A.T.S. ; Cha, C.L.; See, A.; Chan, L.
2001Study of Cu diffusion in Cu/Tan/SiO2/Si multilayer structuresZhang, D.H.; Loh, S.W.; Li, C.Y.; Foo, P.D.; Xie, J.; Liu, R. ; Wee, A.T.S. ; Zhang, L.; Lee, Y.K.
15-Jun-2004Sub-keV secondary ion mass spectrometry depth profiling: Comparison of sample rotation and oxygen floodingLiu, R. ; Wee, A.T.S. 
Jan-2002Substrate temperature studies of SrBi2(Ta1-xNbx)2O9 grown by pulsed laser ablation depositionTay, S.T.; Huan, C.H.A. ; Wee, A.T.S. ; Liu, R. ; Goh, W.C. ; Ong, C.K. ; Chen, G.S.