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LIU RONG
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Showing results 41 to 60 of 60
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Issue Date
Title
Author(s)
Jul-2006
Self-organized nanodot formation on InP(1 0 0) by oxygen ion sputtering
Tan, S.K.
;
Liu, R.
;
Sow, C.H.
;
Wee, A.T.S.
1-Jun-2006
Sharp n-type doping profiles in Si/SiGe heterostructures produced by atomic hydrogen etching
Zhang, J.
;
Turner, S.G.
;
Chiam, S.Y.
;
Liu, R.
;
Tok, E.S.
;
Wee, A.T.S.
;
Huan, A.C.H.
;
Kelly, I.
;
Mulcahy, C.P.A.
15-Jan-2003
SIMS backside depth profiling of ultra shallow implants
Yeo, K.L.
;
Wee, A.T.S.
;
See, A.
;
Liu, R.
;
Ng, C.M.
May-2002
SIMS backside depth profiling of ultrashallow implants using silicon-on-insulator substrates
Yeo, K.L.
;
Wee, A.T.S.
;
Liu, R.
;
Ng, C.M.
;
See, A.
20-Jan-2002
Sims depth profiling analysis of Cu/Ta/SiO2 interfacial diffusion at different annealing temperature
Liu, L.
;
Gong, H.
;
Wang, Y.
;
Wee, A.T.S.
;
Liu, R.
2001
SIMS study of silicon oxynitride rapid thermally grown in nitric oxide
Liu, R.
;
Koa, K.H.
;
Wee, A.T.S.
;
Lai, W.H.
;
Li, M.F.
;
See, A.
;
Chan, L.
1-Jan-2000
Structural characterization of rapid thermal oxidized Si1-x-yGexCy alloy films grown by rapid thermal chemical vapor deposition
Choi, W.K.
;
Chen, J.H.
;
Bera, L.K.
;
Feng, W.
;
Pey, K.L.
;
Mi, J.
;
Yang, C.Y.
;
Ramam, A.
;
Chua, S.J.
;
Pan, J.S.
;
Wee, A.T.S.
;
Liu, R.
Sep-2004
Study of copper diffusion into Ta and TaN barrier materials for MOS devices
Loh, S.W.
;
Zhang, D.H.
;
Li, C.Y.
;
Liu, R.
;
Wee, A.T.S.
20-Jan-2002
Study of copper diffusion into tantalum and tantalum diffusion into copper
Loh, S.W.
;
Zhang, D.H.
;
Li, C.Y.
;
Liu, R.
;
Wee, A.T.S.
2002
Study of copper diffusion into tantalum nitride (Ta2N) by rapid thermal annealing (RTA)
Loh, S.W.
;
Zhang, D.H.
;
Liu, R.
;
Li, C.Y.
;
Wee, A.T.S.
Oct-2001
Study of copper suicide retardation effects on copper diffusion in silicon
Lee, C.S.
;
Gong, H.
;
Liu, R.
;
Wee, A.T.S.
;
Cha, C.L.
;
See, A.
;
Chan, L.
2001
Study of Cu diffusion in Cu/Tan/SiO2/Si multilayer structures
Zhang, D.H.
;
Loh, S.W.
;
Li, C.Y.
;
Foo, P.D.
;
Xie, J.
;
Liu, R.
;
Wee, A.T.S.
;
Zhang, L.
;
Lee, Y.K.
15-Jun-2004
Sub-keV secondary ion mass spectrometry depth profiling: Comparison of sample rotation and oxygen flooding
Liu, R.
;
Wee, A.T.S.
Jan-2002
Substrate temperature studies of SrBi2(Ta1-xNbx)2O9 grown by pulsed laser ablation deposition
Tay, S.T.
;
Huan, C.H.A.
;
Wee, A.T.S.
;
Liu, R.
;
Goh, W.C.
;
Ong, C.K.
;
Chen, G.S.
Oct-2002
Suppression of UV photoluminescence in sandwich-structured Si/C composite films
Zhu, Y.
;
Yuan, C.L.
;
Liu, R.
;
Ong, P.P.
15-Jan-2003
Surface roughening effect in sub-keV SIMS depth profiling
Liu, R.
;
Ng, C.M.
;
Wee, A.T.S.
22-Sep-2005
Surfactant and impurity properties of antimony on GaAs and GaAs 1-xNx on GaAs [100] by solid source molecular beam epitaxy
Cheah, W.K.
;
Fan, W.J.
;
Yoon, S.F.
;
Tan, K.H.
;
Liu, R.
;
Wee, A.T.S.
2001
The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profiling
Lau, G.S.
;
Tok, E.S.
;
Wee, A.T.S.
;
Liu, R.
;
Lim, S.L.
2000
The use of sample rotation in SIMS profiling of Ta barrier layers to Cu diffusion
Liu, R.
;
Wee, A.T.S.
;
Liu, L.
;
Hao, G.
Aug-2004
Thermal stability of Cu/Ta/ultra low k porous polymer structures for multilevel interconnects
Zhang, D.H.
;
Yang, L.Y.
;
Li, C.Y.
;
Liu, R.
;
Wee, A.T.S.
;
Foo, P.D.