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Sim Kian Sin
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Showing results 1 to 7 of 7
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Issue Date
Title
Author(s)
Sep-1993
A simulation model for electron irradiation induced specimen charging in a scanning electron microscope
Chan, D.S.H.
;
Sim, K.S.
;
Phang, J.C.H.
;
Balk, L.J.
;
Uchikawa, Y.
;
Hasselbach, F.
;
Dinnis, A.R.
1994
Charging dynamics of integrated circuit passivation layer probe holes in the electron beam tester
Phang, J.C.H.
;
Sim, K.S.
;
Chan, D.S.H.
Nov-1995
Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam tester
Sim, K.S.
;
Phang, J.C.H.
;
Chan, D.S.H.
Mar-1994
Investigation of capacitive coupling voltage contrast using a specimen charging model
Sim, K.
;
Chan, D.
;
Phang, J.
Mar-1994
Investigation of capacitive coupling voltage contrast using a specimen charging model
Sim, K.
;
Chan, D.
;
Phang, J.
Dec-1992
Modelling techniques for the quantification of some electron beam induced phenomena
Chim, W.K.
;
Chan, D.S.H.
;
Low, T.S.
;
Phang, J.C.H.
;
Sim, K.S.
;
Pey, K.L.
;
Dinnis, A.R.
;
Holt, D.B.
;
Nakamae, K.
;
Schottler, M.
Dec-1992
Modelling techniques for the quantification of some electron beam induced phenomena
Chim, W.K.
;
Chan, D.S.H.
;
Low, T.S.
;
Phang, J.C.H.
;
Sim, K.S.
;
Pey, K.L.
;
Dinnis, A.R.
;
Holt, D.B.
;
Nakamae, K.
;
Schottler, M.
