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Issue DateTitleAuthor(s)
Mar-1986A comparative study of extraction methods for solar cell model parametersChan, D.S.H. ; Phillips, J.R.; Phang, J.C.H. 
Jun-2013A complete and computationally efficient numerical model of aplanatic solid immersion lens scanning microscopeChen, R.; Agarwal, K. ; Sheppard, C.J.R.; Phang, J.C.H. ; Chen, X. 
1994A direct and accurate method for the extraction of diffusion length and surface recombination velocity from an EBIC line scanOng, V.K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
2007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
Oct-1997A novel method for the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
Mar-1998A portable scanning electron microscope column design based on the use of permanent magnetsKhursheed, A. ; Phang, J.C. ; Thong, J.T.L. 
Jul-1986A review of curve fitting error criteria for solar cell I-V characteristicsPhang, J.C.H. ; Chan, D.S.H. 
2004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
2005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
Nov-1997A robust focusing and astigmatism correction method for the scanning electron microscopeOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Jun-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing methodOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Aug-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved techniqueOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Sep-1993A simulation model for electron irradiation induced specimen charging in a scanning electron microscopeChan, D.S.H. ; Sim, K.S. ; Phang, J.C.H. ; Balk, L.J.; Uchikawa, Y.; Hasselbach, F.; Dinnis, A.R.
2009Advanced dynamic failure analysis on interconnects by vectorized scanning joule expansion MicroscopyTiedemann, A.-K.; Fakhri, M.; Heiderhoff, R.; Phang, J.C.H. ; Balk, L.J.
Jun-1993An energy dependent model for type I magnetic contrast in the scanning electron microscopeChim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Low, T.S. ; Thirumalai, S.
1997Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscopeTao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.
2005Analysis of E-field distributions within high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Heiderhoff, R.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. ; Niedernostheide, F.-J.; Schulze, H.-J.
Sep-2001Analysis of high-power devices using proton beam induced charge microscopyZmeck, M.; Phang, J. ; Bettiol, A. ; Osipowicz, T. ; Watt, F. ; Balk, L.; Niedernostheide, F.-J.; Schulze, H.-J.; Falck, E.; Barthelmess, R.
2005Analysis of premature breakdown in high-power devices using IBIC microscopyZmeck, M.; Balk, L.J.; Pugatschow, A.; Niedernostheide, F.-J.; Schulze, H.-J.; Osipowicz, T. ; Watt, F. ; Phang, J.C.H. ; Khambadkone, A.M. 
Feb-1987ANALYTICAL METHODS FOR THE EXTRACTION OF SOLAR-CELL SINGLE- AND DOUBLE-DIODE MODEL PARAMETERS FROM I-V CHARACTERISTICS.Chan, Daniel S.H. ; Phang, Jacob C.H.