Browsing by Author HUAN CHENG HON,ALFRED

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Issue DateTitleAuthor(s)
Oct-1999(2×1) Oxygen superstructure on Cu(210) surface studied by quantitative LEED analysis and STMTan, K.C.; Guo, Y.P. ; Wee, A.T.S. ; Huan, C.H.A. 
Jan-1994A comparative study of the initial oxygen and water reactions on germanium and silicon using simsWee, A.T.S. ; Huan, C.H.A. ; Thong, P.S.P.; Tan, K.L. 
Feb-1996A Raman study of RbSnBr3Kuok, M.H. ; Tan, L.S.; Shen, Z.X. ; Huan, C.H. ; Mok, K.F. 
1-Jun-1997AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beamsPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
Dec-1996AES analysis of silicon nitride formation by 10 keV N+ and N+ 2 ion implantationPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
14-Mar-2005Al2O3-incorporation effect on the band structure of Ba0.5Sr0.5TiO3 thin filmsZheng, Y.B.; Wang, S.J.; Huan, A.C.H. ; Tan, C.Y. ; Yan, L. ; Ong, C.K. 
Jun-1999Amorphous hydrogenated carbon synthesized by pulsed laser deposition from cyclohexaneLu, Y.F. ; Huang, S.M.; Huan, C.H.A. ; Luo, X.F.
1-Dec-1995An alternative method for determining the transmission function of secondary ion mass spectrometersLow, M.H.S.; Huan, C.H.A. ; Wee, A.T.S. ; Tan, K.L. 
Jan-1994An investigation of the Ar+ ion-enhanced reaction of CCl4 on Si(100) by secondary ion mass spectrometryWee, A.T.S. ; Huan, C.H.A. ; Tan, K.L. ; Tan, R.S.K.
15-Mar-1996Argon incorporation and silicon carbide formation during low energy argon-ion bombardment of Si(100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
15-Dec-1996Argon incorporation and surface compositional changes in InP(100) due to low-energy Ar+ ion bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
21-Sep-1997ARXPS analysis of surface compositional change in Ar+ ion bombarded GaAs (100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
Nov-1998Atomic force microscopy investigation of the O2 +-induced surface topography of InPPan, J.S. ; Tay, S.T.; Huan, C.H.A. ; Wee, A.T.S. 
Apr-2004Atomic-scale structure of the fivefold surface of an AlPdMn quasicrystal: A quantitative x-ray photoelectron diffraction analysisZheng, J.-C. ; Huan, C.H.A. ; Wee, A.T.S. ; Van Hove, M.A.; Fadley, C.S.; Shi, F.J.; Rotenberg, E.; Barman, S.R.; Paggel, J.J.; Horn, K.; Ebert, Ph.; Urban, K.
Jul-1998Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAsPan, J.S. ; Huan, C.H.A. ; Wee, A.T.S. ; Tan, H.S. ; Tan, K.L. 
7-Jul-2000C60-containing polymer complexes: Complexation between multifunctional 1-(4-methyl)piperazinyl-fullerene or N-[(2-piperidyl)ethyl]aminofullerene and proton-donating polymersGoh, S.H. ; Lee, S.Y. ; Lu, Z.H.; Huan, C.H.A. 
1999Characterization of a low-k organic spin-on-glass as an intermetal dielectricWang, C.Y.; Zheng, J.Z.; Shen, Z.X. ; Xu, Y.; Lim, S.L.; Liu, R. ; Huan, A.C.H. 
Aug-2002Characterization of fluoropolymer films deposited by magnetron sputtering of poly(tetrafluoroethylene) and plasma polymerization of heptadecafluoro-1-decene (HDFD) on (100)-oriented single-crystal silicon substratesZhang, Y. ; Yang, G.H.; Kang, E.T. ; Neoh, K.G. ; Huang, W. ; Huan, A.C.H. ; Lai, D.M.Y.
18-Jan-2000Complexation between hydrogensulfated fullerenol and poly(4-vinylpyridine)Huang, X.-D.; Goh, S.H. ; Lee, S.Y.; Huan, C.H.A. 
1-May-2000Composition and diffusion of nitrogenated carbon into the magnetic layerTomcik, B.; Osipowicz, T. ; Huan, C.H.