Browsing by Author THONG THIAM LEONG,JOHN

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Issue DateTitleAuthor(s)
Oct-1997A novel method for the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
Mar-1998A portable scanning electron microscope column design based on the use of permanent magnetsKhursheed, A. ; Phang, J.C. ; Thong, J.T.L. 
Nov-1997A robust focusing and astigmatism correction method for the scanning electron microscopeOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Jun-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part II: Autocorrelation-based coarse focusing methodOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Aug-1998A robust focusing and astigmatism correction method for the scanning electron microscope - Part III: An improved techniqueOng, K.H.; Phang, J.C.H. ; Thong, J.T.L. 
Jan-2003Add-on transmission attachments for the scanning electron microscopeKhursheed, A. ; Karuppiah, N. ; Osterberg, M. ; Thong, J.T.L. 
10-May-2011An electrically tuned solid-state thermal memory based on metal-insulator transition of single-crystalline VO2 nanobeamsXie, R. ; Bui, C.T.; Varghese, B. ; Zhang, Q.; Sow, C.H. ; Li, B. ; Thong, J.T.L. 
1999Automatic DRAM cell location in the SEMThong, J.T.L. ; Zhu, Y. ; Phang, J.C.H. 
2000Automatic IC Die Positioning in the SEMTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
2002Automatic integrated circuit die positioning in the scanning electron microscopeTan, H.W.; Phang, J.C.H. ; Thong, J.T.L. 
18-Oct-2010Capturing a DNA duplex under near-physiological conditionsZhang, H.; Xu, W.; Liu, X. ; Stellacci, F.; Thong, J.T.L. 
1-Dec-1998Characterisation of pyramid formation arising from the TMAH etching of siliconChoi, W.K. ; Thong, J.T.L. ; Luo, P.; Tan, C.M.; Chua, T.H.; Bai, Y. 
2006Characteristics of single metallic nanowire growth via a field-emission induced processOon, C.H.; Khong, S.H. ; Boothroyd, C.B.; Thong, J.T.L. 
1995Charging control using pulsed scanning electron microscopyWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
1997Charging identification and compensation in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
4-Dec-2006Co-synthesis of ZnO-CuO nanostructures by directly heating brass in airZhu, Y. ; Sow, C.-H. ; Yu, T.; Zhao, Q.; Li, P.; Shen, Z.; Yu, D.; Thong, J.T.-L. 
20-Aug-2012Cobalt-mediated crystallographic etching of graphite from defectsWang, R.; Wang, J.; Gong, H. ; Luo, Z.; Zhan, D.; Shen, Z.; Thong, J.T.L. 
Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
2002Connection of nanostructures using nanowires grown by a self-field emission processThong, J.T.L. ; Oon, C.H.; You, G.F.; Yeong, K.S.
Feb-2014Control of surface morphology and crystal structure of silicon nanowires and their coherent phonon transport characteristicsLee, S.-Y.; Kim, G.-S.; Lim, J.; Han, S.; Li, B. ; Thong, J.T.L. ; Yoon, Y.-G.; Lee, S.-K.