Browsing by Author KHURSHEED,ANJAM

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Issue DateTitleAuthor(s)
Jul-2011A high signal-to-noise ratio toroidal electron spectrometer for the SEMHoang, H.Q. ; Osterberg, M. ; Khursheed, A. 
2001A high-resolution add-on in-lens attachment for scanning electron microscopesKhursheed, A. ; Karuppiah, N. ; Koh, S.H.
Aug-2002A high-resolution mixed field immersion lens attachment for conventional scanning electron microscopesKhursheed, A. ; Karuppiah, N. 
2002A low voltage time of flight electron emission microscopeKhursheed, A. 
Jul-2005A method of dynamic chromatic aberration correction in low-voltage scanning electron microscopesKhursheed, A. 
Mar-2009A multi-beam ion/electron spectra-microscope designKhursheed, A. 
21-Jul-2011A parallel magnetic sector mass analyzer designCheong, K.H.; Khursheed, A. 
Mar-1998A portable scanning electron microscope column design based on the use of permanent magnetsKhursheed, A. ; Phang, J.C. ; Thong, J.T.L. 
11-Apr-2011A radial mirror analyzer for scanning electron/ion microscopesHoang, H.Q. ; Khursheed, A. 
Dec-2008A second-order focusing electrostatic toroidal electron spectrometer with 2π radian collectionKhursheed, A. ; Hoang, H.Q. 
Dec-2008A second-order focusing electrostatic toroidal electron spectrometer with 2π radian collectionKhursheed, A. ; Hoang, H.Q. 
Nov-2004A spectroscopic scanning electron microscope designKhursheed, A. ; Osterberg, M. 
2006A spectroscopic SEM: First resultsOsterberg, M. ; Khursheed, A. 
Jan-2012A wide-range Parallel Radial Mirror Analyzer for scanning electron/ion microscopesKhursheed, A. ; Hoang, H.Q. ; Srinivasan, A.
Dec-2002Aberration characteristics of immersion lenses for LVSEMKhursheed, A. 
1999Accurate ray tracing through finite element solved potential distributions in charged particle opticsAiming, Zhu; Khursheed, A. 
2002Add-on lens attachments for the scanning electron microscopeKhursheed, A. 
Jan-2003Add-on transmission attachments for the scanning electron microscopeKhursheed, A. ; Karuppiah, N. ; Osterberg, M. ; Thong, J.T.L. 
Mar-2001An add-on secondary electron energy spectrometer for scanning electron microscopesKhursheed, A. ; Karuppiah, N.
Jan-1998An on-pole-piece-tip deflector for high-resolution, low-voltage scanning electron microscopesZhao, Y.; Khursheed, A.