Browsing by Author HOU YONG TIAN

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Issue DateTitleAuthor(s)
Dec-2001A simple and efficient model for quantization effects of hole inversion layers in MOS devicesHou, Y.-T. ; Li, M.-F. 
21-Feb-2000An analysis of temperature dependent piezoelectric Franz-Keldysh effect in AlGaNHou, Y.T. ; Teo, K.L. ; Li, M.F. ; Uchida, K.; Tokunaga, H.; Akutsu, N.; Matsumoto, K.
1999Characterization of MBE-grown Ga1-xAlxAs alloy films by Raman scatteringHou, Y.T. ; Feng, Z.C.; Li, M.F. ; Chua, S.J. 
30-May-2000Correlation between the infrared reflectance and microstructure of thin gallium nitride films grown on silicon substratesHou, Y.T. ; Feng, Z.C.; Chen, J.; Zhang, X.; Chua, S.J. ; Lin, J.Y. 
May-2002Direct tunneling currents through gate dielectrics in deep submicron MOSFETsHou, Y. ; Li, M. ; Jin, Y.
1-Jan-2002Direct tunneling hole currents through ultrathin gate oxides in metal-oxide-semiconductor devicesHou, Y.T. ; Li, M.F. ; Jin, Y.; Lai, W.H.
20-Sep-2004Electron mobility in Ge and strained-Si channel ultrathin-body metal-oxide semi conductor field-effect transistorsLow, T.; Li, M.F. ; Shen, C.; Yeo, Y.-C. ; Hou, Y.T. ; Zhu, C. ; Chin, A.; Kwong, D.L.
Mar-2004Fermi-Level Pinning Induced Thermal Instability in the Effective Work Function of TaN in TaN/SiO 2 Gate StackRen, C.; Yu, H.Y. ; Kang, J.F. ; Hou, Y.T. ; Li, M.-F. ; Wang, W.D.; Chan, D.S.H. ; Kwong, D.-L.
2003Germanium MOS: An Evaluation from Carrier Quantization and Tunneling CurrentLow, T.; Hou, Y.T. ; Li, M.F. ; Zhu, C. ; Kwong, D.-L.; Chin, A.
Jun-2001Hole quantization effects and threshold voltage shift in pMOSFET - Assessed by improved one-band effective mass approximationHou, Y.T. ; Li, M.-F. 
May-2002Hole tunneling current through oxynitride/oxide stack and the stack optimization for p-MOSFETsYu, H.Y. ; Hou, Y.T. ; Li, M.F. ; Kwong, D.-L.
May-2002Hole tunneling current through oxynitride/oxide stack and the stack optimization for p-MOSFETsYu, H.Y. ; Hou, Y.T. ; Li, M.F. ; Kwong, D.-L.
2004Impact of metal gate work function on nano CMOS device performanceHou, Y.T. ; Low, T.; Xu, B.; Li, M.-F. ; Samudra, G. ; Kwong, D.L.
May-2003Improved one-band self-consistent effective mass methods for hole quantization in p-MOSFETLow, T.; Hou, Y.-T. ; Li, M.-F. 
May-2003Improved one-band self-consistent effective mass methods for hole quantization in p-MOSFETLow, T.; Hou, Y.-T. ; Li, M.-F. 
15-Nov-1999Influence of Si doping on the infrared reflectance characteristics of GaN grown on sapphireHou, Y.T. ; Feng, Z.C.; Chua, S.J. ; Li, M.F. ; Akutsu, N.; Matsumoto, K.
15-Nov-1999Influence of Si doping on the infrared reflectance characteristics of GaN grown on sapphireHou, Y.T. ; Feng, Z.C.; Chua, S.J. ; Li, M.F. ; Akutsu, N.; Matsumoto, K.
Dec-2001Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substratesFeng, Z.C.; Yang, T.R.; Hou, Y.T. 
Dec-2001Infrared reflectance analysis of GaN epitaxial layers grown on sapphire and silicon substratesFeng, Z.C.; Yang, T.R.; Hou, Y.T. 
Nov-1999Infrared reflectance investigation of undoped and Si-doped GaN films on sapphireFeng, Z.C.; Hou, Y.T. ; Li, M.F. ; Chua, S.J. ; Wang, W.; Zhu, L.