Browsing by Author WONG KIN MUN

Showing results 1 to 11 of 11
Issue DateTitleAuthor(s)
Mar-2006Accurate modeling of the effects of fringing area interface traps on scanning capacitance microscopy measurementHong, Y.D.; Yeow, Y.T.; Chim, W.K. ; Yan, J.; Wong, K.M. 
2007Deep-depletion physics-based analytical model for scanning capacitance microscopy carrier profile extractionWong, K.M. ; Chim, W.K. 
24-Jun-2002Dopant extraction from scanning capacitance microscopy measurements of p-n junctions using combined inverse modeling and forward simulationChim, W.K. ; Wong, K.M. ; Teo, Y.L.; Lei, Y. ; Yeow, Y.T.
2004Dopant profile extraction by inverse modeling of scanning capacitance microscopy using peak dC/dVHong, Y.D.; Yan, J.; Wong, K.M. ; Yeow, Y.T.; Chim, W.K. 
Sep-2004Influence of interface traps and surface mobility degradation on scanning capacitance microscopy measurementHong, Y.D.; Yeow, Y.T.; Chim, W.-K. ; Wong, K.-M. ; Kopanski, J.J.
Oct-2003Monitoring Oxide Quality Using the Spread of the dC/dV Peak in Scanning Capacitance Microscopy MeasurementsChim, W.K. ; Wong, K.M. ; Yeow, Y.T.; Hong, Y.D.; Lei, Y. ; Teo, L.W.; Choi, W.K. 
2005Physical mechanism of oxide interfacial traps, carrier mobility degradation and series resistance on contrast reversal in scanning-capacitance-microscopy dopant concentration extractionWong, K.M. ; Chim, W.K. ; Yan, J.
2008Scanning capacitance microscopy detection of charge trapping in free-standing germanium nanodots and the passivation of hole trap sitesWong, K.M. ; Chim, W.K. ; Huang, J.Q.; Zhu, L.
2007Spatial distribution of interface trap density in strained channel transistors using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurementsWong, K.M. ; Chim, W.K. ; Ang, K.W.; Yeo, Y.C. 
2009Study of the electronic structure of individual free-standing germanium nanodots using spectroscopic scanning capacitance microscopyWong, K.M. 
2006Theoretical model of interface trap density using the spread of the differential capacitance characteristics in scanning capacitance microscopy measurementsWong, K.M. ; Chim, W.K.