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| Issue Date | Title | Author(s) |
| 1997 | Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope | Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y. |
| Jul-1996 | Design and performance of a new spectroscopic photon emission microscope system for the physical analysis of semiconductor devices | Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. ; Liu, Y.Y.; Tao, J.M. |
| 7-Sep-1997 | Distinguishing the effects of oxide trapped charges and interface states in DDD and LATID nMOSFETs using photon emission spectroscopy | Chim, W.K. ; Chan, D.S.H. ; Tao, J.M. ; Lou, C.L.; Leang, S.E.; Teow, C.K. |
| 1996 | High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capability | Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y. |
| 1996 | High-sensitivity photon emission microscope system with continuous wavelength spectroscopic capability | Tao, J.M. ; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y. |
| 1999 | Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis | Ng, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. |
| 1999 | Integrated (automated) photon emission microscope and MOSFET characterization system for combined microscopic and macroscopic device analysis | Ng, T.H.; Chim, W.K. ; Chan, D.S.H. ; Phang, J.C.H. ; Liu, Y.Y.; Lou, C.L.; Leang, S.E.; Tao, J.M. |
| 3-Mar-1998 | Integrated emission microscope for panchromatic imaging, continuous wavelength spectroscopy and selective area spectroscopic mapping | CHIM, WAI KIN ; CHAN, DANIEL SIU HUNG ; PHANG, JACOB CHEE HONG ; TAO, JING MEI ; LIU, YONG YU |
| 1995 | New spectroscopic photon emission microscope system for semiconductor device analysis | Liu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. |
| 1995 | New spectroscopic photon emission microscope system for semiconductor device analysis | Liu, Y.Y.; Tao, J.M. ; Chan, D.S.H. ; Phang, J.C.H. ; Chim, W.K. |
| 14-May-1996 | Spectroscopic observations of photon emissions in n-MOSFETs in the saturation region | Tao, J.M. ; Chan, D.S.H. ; Chim, W.K. |
