Please use this identifier to cite or link to this item:
|Title:||Properties of the CdTe/InSb interface studied by optical and surface analytical techniques|
|Citation:||Feng, Z.C., Hung, S.Y., Wee, A.T.S. (2006-07). Properties of the CdTe/InSb interface studied by optical and surface analytical techniques. Physica Status Solidi (A) Applications and Materials Science 203 (9) : 2181-2185. ScholarBank@NUS Repository. https://doi.org/10.1002/pssa.200566013|
|Abstract:||Indium interdiffusion in-MBE-grown CdTe/InSb heterostructures was studied by optical and surface techniques of photoluminescence (PL), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). A correlation between the two types of investigations is established. © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.|
|Source Title:||Physica Status Solidi (A) Applications and Materials Science|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Jul 6, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.