Properties of the CdTe/InSb interface studied by optical and surface analytical techniques

Please use this identifier to cite or link to this item: https://doi.org/10.1002/pssa.200566013

Title:	Properties of the CdTe/InSb interface studied by optical and surface analytical techniques
Authors:	Feng, Z.C. Hung, S.Y. Wee, A.T.S.
Issue Date:	Jul-2006
Citation:	Feng, Z.C., Hung, S.Y., Wee, A.T.S. (2006-07). Properties of the CdTe/InSb interface studied by optical and surface analytical techniques. Physica Status Solidi (A) Applications and Materials Science 203 (9) : 2181-2185. ScholarBank@NUS Repository. https://doi.org/10.1002/pssa.200566013
Abstract:	Indium interdiffusion in-MBE-grown CdTe/InSb heterostructures was studied by optical and surface techniques of photoluminescence (PL), X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). A correlation between the two types of investigations is established. © 2006 WILEY-VCH Verlag GmbH & Co. KGaA.
Source Title:	Physica Status Solidi (A) Applications and Materials Science
URI:	http://scholarbank.nus.edu.sg/handle/10635/98846
ISSN:	18626300
DOI:	10.1002/pssa.200566013
Appears in Collections:	Staff Publications

There are no files associated with this item.

Check