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|Title:||Optical limiting properties of neutral nickel dithiolenes|
|Authors:||Tan, Wei Lian|
Zuo, Jing Lin
Bai, Jun Feng
You, Xiao Zeng
Lim, Jin Hong
Yang, Sidney S.
Hagan, David J.
Van Stryland, Eric W.
|Source:||Tan, Wei Lian,Ji, Wei,Zuo, Jing Lin,Bai, Jun Feng,You, Xiao Zeng,Lim, Jin Hong,Yang, Sidney S.,Hagan, David J.,Van Stryland, Eric W. (1999). Optical limiting properties of neutral nickel dithiolenes. Proceedings of SPIE - The International Society for Optical Engineering 3899 : 475-482. ScholarBank@NUS Repository.|
|Abstract:||Wide applications of lasers have stimulated a great interest in development of optical limiting devices. These devices can be used to protect optical sensors from laser-reduced damage because their transmission is high when they are exposed to low-power laser light, and their transmission becomes low when irradiated by intense laser beams. Here we report such a device based on nonlinear optical effects in two neutral nickel complexes with multi-sulfur 1,2 dithiolene ligands, [Ni(medt)2] 1 (medt; 5,6-dihydro-6-methyl-1,4-dithiin-2,3-dithiolate) and [Ni(phdt)2] 2 (phdt = 5,6-dihydro-5-phenyl-1,4-dithiin-2,3-dithiolate). The limiting device consisted of a focusing setup and a 1-mm-thick cell, which contained a benzene solution of one of the complexes. The limiting properties were investigated by both nanosecond and picosecond laser pulses. At 532 nm, the limiting thresholds of complexes 1 and 2 measured by the picosecond laser pulses with a (f/25) focusing geometry were determined to be approximately 0.3 J/cm2. The linear absorption spectra of the two complexes also indicated that their limiting response should cover the visible and near-infrared region (up to 900 nm). All these results show their limiting performance is superior to the limiting effect in C60. Picosecond time-resolved pump-probe and Z-scan experiments revealed that the observed limiting effects should originate from excited-state absorption and refraction.|
|Source Title:||Proceedings of SPIE - The International Society for Optical Engineering|
|Appears in Collections:||Staff Publications|
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