Please use this identifier to cite or link to this item: https://doi.org/10.1088/0953-8984/7/23/007
Title: XPS and SIMS studies of MBE-grown CdTe/InSb(001) heterostructures
Authors: Wee, A.T.S. 
Feng, Z.C. 
Hng, H.H.
Tan, K.L. 
Farrow, R.F.C.
Choyke, W.J.
Issue Date: 1995
Citation: Wee, A.T.S., Feng, Z.C., Hng, H.H., Tan, K.L., Farrow, R.F.C., Choyke, W.J. (1995). XPS and SIMS studies of MBE-grown CdTe/InSb(001) heterostructures. Journal of Physics: Condensed Matter 7 (23) : 4359-4369. ScholarBank@NUS Repository. https://doi.org/10.1088/0953-8984/7/23/007
Abstract: A series of MBE-grown CdTe/InSb(001) heterostructures with different substrate growth temperatures is studied using X-ray photoelectron spectroscopy (XPS) and secondary-ion mass spectrometry (SIMS). XPS shows that Te exists mainly as TeO2 at the sample surface, while In exists as In 2O and In2O3. The Cd/Te ratio is greater than one indicating that the surface is Cd rich. Both XPS and SIMS reveal In interdiffusion directly. The SIMS depth profiles and the XPS In 3D and 4D spectra indicate that the In concentration in the CdTe film grown at high substrate growth temperature, Ts, is significantly higher than at low Ts. This is attributed to the diffusion of indium across the CdTe/InSb interface from the InSb substrate. Dislocations also enhance the diffusion of In from the InSb substrate. It is deduced that CdTe and InSb have an exact lattice match at growth temperatures of about 180 degrees C since the surface In concentration is a minimum for samples grown at Ts approximately 180 degrees C. The SIMS depth profiles for Te+ also give evidence of some diffusion of tellurium across the interface into the substrate for samples grown at high Ts. Furthermore, the SIMS data suggest that some InxTey compound, probably In 2Te3, forms at the interface, but further studies using other analytical techniques are required to confirm this.
Source Title: Journal of Physics: Condensed Matter
URI: http://scholarbank.nus.edu.sg/handle/10635/98597
ISSN: 09538984
DOI: 10.1088/0953-8984/7/23/007
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

16
checked on Dec 11, 2018

WEB OF SCIENCETM
Citations

15
checked on Nov 26, 2018

Page view(s)

48
checked on Nov 16, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.