Please use this identifier to cite or link to this item:
|Title:||Thermal control unit for microwave measurements of conductivity of a semiconducting material|
|Authors:||Oh, K.H. |
|Citation:||Oh, K.H., Ong, C.K., Tan, B.T.G. (1989-10). Thermal control unit for microwave measurements of conductivity of a semiconducting material. Journal of Physics E: Scientific Instruments 22 (10) : 876-879. ScholarBank@NUS Repository. https://doi.org/10.1088/0022-3735/22/10/014|
|Abstract:||A simple thermal control unit, together with a transmission microwave bridge have been constructed for the measurement of electrical conductivity at the X-band frequency of a silicon sample in the range 323 to 573 K. The temperature dependence of the conductivity and hence the band gap of Si were obtained. The technique may be used for other semiconducting materials.|
|Source Title:||Journal of Physics E: Scientific Instruments|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 17, 2019
WEB OF SCIENCETM
checked on Mar 6, 2019
checked on Mar 15, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.