Please use this identifier to cite or link to this item:
|Title:||Temperature dependence of solvation forces as measured in atomic force microscopy|
|Citation:||Lim, L.T.W., Wee, A.T.S., O'Shea, S.J. (2009). Temperature dependence of solvation forces as measured in atomic force microscopy. Journal of Chemical Physics 130 (13) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3096967|
|Abstract:||An atomic force microscope (AFM) has been used to study the effect of temperature on solvation forces in the liquids octamethylcyclotetrasiloxane, n -hexadecane, and n -dodecanol confined between the AFM tip and a graphite surface. Discrete solvation layers can be observed for all three liquids at all the temperatures measured (298-348K). However, with increasing temperature there is a significant decrease in the magnitude of the measured solvation forces and a reduction in the number of solvation oscillations which can be observed. Solvation forces per se are only weakly temperature dependent and the most plausible explanation is that we are measuring how the layers are squeezed from the tip-sample gap. The squeeze out process is a thermally activated phenomenon and gives rise to the large change in the magnitude of the force oscillations with temperature. A simple analysis is provided based on transition rate theory. The large change in solvation force with temperature has implications for the measurement of localized forces using AFM, particularly in interpreting biological interactions and single asperity friction. © 2009 American Institute of Physics.|
|Source Title:||Journal of Chemical Physics|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Mar 19, 2019
WEB OF SCIENCETM
checked on Mar 4, 2019
checked on Mar 1, 2019
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.