Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.1899151
Title: Switching in organic devices caused by nanoscale Schottky barrier patches
Authors: Kunardi, L.
Troadec, C.
Chandrasekhar, N. 
Issue Date: 22-May-2005
Source: Kunardi, L., Troadec, C., Chandrasekhar, N. (2005-05-22). Switching in organic devices caused by nanoscale Schottky barrier patches. Journal of Chemical Physics 122 (20) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.1899151
Abstract: We have identified a possible electronic origin of metal filaments, invoked to explain the switching behavior of organic devices. Interfaces of two representative organics polyparaphenylene (PPP) and poly(2-methoxy-5-2-ethyl- hexyloxy-1,4-phenylenevinylene) with Ag are investigated using ballistic emission microscopy. Nanometer scale spatial nonuniformity of carrier injection is observed in ballistic electron emission microscopy images of both interfaces. The measured Schottky barrier (SB) appears to be consistent with metal states tailing into the gap of the PPP. We find that the SB values exhibit a distribution, even for the diodes with low ideality factors. The implications of this distribution on the measured physical properties of the diode are discussed, in light of work on devices of similar geometry, published in the literature. We also demonstrate that patches of low SB are likely to nucleate current filaments which can cause local ionization and are reported to be responsible for the switching behavior observed in metal-organic, metal-CuS and Ag-AgSe structures. © 2005 American Institute of Physics.
Source Title: Journal of Chemical Physics
URI: http://scholarbank.nus.edu.sg/handle/10635/98154
ISSN: 00219606
DOI: 10.1063/1.1899151
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

SCOPUSTM   
Citations

3
checked on Feb 20, 2018

WEB OF SCIENCETM
Citations

5
checked on Nov 23, 2017

Page view(s)

29
checked on Feb 16, 2018

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.